Author

R. W. Ryan

Observed names: R. Ryan, R. W. RYAN, R.W Ryan, R.W. Ryan, Robert W. Ryan
OpenAlex ID: A5034425096
1988 · R. J. Malik, R. N. Nottenberg, et al. · Applied Physics Letters · 144
1992 · R. J. Malik, J. Nagle, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 35
1996 · E.F. Chor, R.J. Malik, et al. · IEEE Electron Device Letters · 27
1995 · J. Lin, Y.K. Chen, et al. · IEEE Microwave and Guided Wave Letters · 25
1988 · R.J. Malik, L.M. Lunardi, et al. · IEEE Electron Device Letters · 23
1998 · R. F. Kopf, R. A. Hamm, et al. · Journal of Electronic Materials · 15
2002 · R.K. Montgomery, D.A. Humphrey, et al. · IEEE MTT-S International Microwave Symposium digest · 13
1998 · R.F Kopf, R.A Hamm, et al. · Solid-State Electronics · 9
2000 · R. F. Kopf, R. A. Hamm, et al. · Journal of Electronic Materials · 7
1997 · F. Ren, J.R. Lothian, et al. · Solid-State Electronics · 7
1989 · J. M. Bonar, R. Hull, et al. · MRS Proceedings · 7
1998 · R. W. Ryan, R. F. Kopf, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
1990 · Leda M. Lunardi, Roger J. Malik, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2002 · R.J. Malik, Y. Anand, et al. · IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits · 1
1999 · J. Burm, A. Tate, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1
1998 · R. F. Kopf, R. A. Hamm, et al. · Journal of Electronic Materials · 1
1998 · R. W. Ryan, R. F. Kopf, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1
Works count: 36
Citation count: 479
H-index: 13
I10-index: 13
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