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G. A. Koné
Observed names:
A. Koné, G.,
G. A. Kone,
G.A. Kone,
G.A. Koné,
Gilles A. Kone,
Gilles Amadou Koné,
Kone, Gilles Amadou,
Koné, Gilles Amadou
show all 8
Institution:
Laboratoire de l'Intégration du Matériau au Système
Observed institutions:
Centre National de la Recherche Scientifique,
Université de Bordeaux,
Commissariat à l'Énergie Atomique et aux Énergies Alternatives,
III V Lab,
Laboratoire de l'Intégration du Matériau au Système,
Université Bordeaux-I
show all 6
OpenAlex ID:
A5035176139
Trends in Submicrometer InP-Based HBT Architecture Targeting Thermal Management
2011
·
Brice Grandchamp
, Virginie Nodjiadjim
, et al.
·
IEEE Transactions on Electron Devices
·
20
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
2010
·
G.A. Koné
, B. Grandchamp
, et al.
·
Microelectronics Reliability
·
14
Submicrometer InP/InGaAs DHBT Architecture Enhancements Targeting Reliability Improvements
2013
·
Gilles A. Kone
, Brice Grandchamp
, et al.
·
IEEE Transactions on Electron Devices
·
13
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses
2011
·
G.A. Koné
, B. Grandchamp
, et al.
·
Microelectronics Reliability
·
13
Advancements on reliability-aware analog circuit design
2012
·
B. Ardouin
, J.-Y. Dupuy
, et al.
·
European Solid-State Circuits Conference (ESSCIRC)
·
12
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
2011
·
S. Ghosh
, B. Grandchamp
, et al.
·
Microelectronics Reliability
·
12
Thermal aging model of InP/InGaAs/InP DHBT
2010
·
S. Ghosh
, F. Marc
, et al.
·
Microelectronics Reliability
·
11
Advancements on reliability-aware analog circuit design
2012
·
B. Ardouin
, J.-Y. Dupuy
, et al.
·
European Solid-State Device Research Conference
·
10
Benchmarking of HBT models for InP based DHBT modeling
2010
·
S. Ghosh
, T. Zimmer
, et al.
·
IEEE International Conference on Microelectronics (MIEL)
·
4
Analysis of InP/GaAsSb DHBT failure mechanisms under accelerated aging tests
2012
·
G.A. Kone
, C. Maneux
, et al.
·
Conference proceedings. ... International Conference on Indium Phosphide and Related Materials
·
2
Preliminary results of storage accelerated aging test on InP/GaAsSb DHBT
2011
·
Kone, Gilles Amadou
, Ghosh, S.
, et al.
·
HAL
·
2
Reliability of submicron InGaAs/InP DHBT on Accelerated Aging Tests under Thermal and Electrical stresses
2011
·
A. Koné, G.
, Grandchamp, B.
, et al.
·
HAL
·
1
Practical implementation of reliability aware compact models in simulation software environnement
2017
·
Ardouin, Bertrand
, Thomas, Zimmer
, et al.
·
HAL
Caractérisation des effets thermiques et des mécanismes de défaillance spécifiques aux transistors bipolaires submicroniques sur substrat InP dédiés aux transmissions optiques Ethernet à 112 Gb/s
2011
·
Gilles Amadou Koné
·
theses.fr (ABES)
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Works count:
14
Citation count:
114
H-index:
8
I10-index:
8
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