Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Binhao Lian
Observed name:
B.H. Lian
Institution:
Beijing Microelectronics Technology Institute
Observed institutions:
Beijing Microelectronics Technology Institute,
National Center for Women and Children’s Health, China CDC,
China Central Television
OpenAlex ID:
A5037578599
Effects of silicon via profile on passivation and metallization in TSV interposers for 2.5D integration
2015
·
P.R. Lin
, G.Q. Zhang
, et al.
·
Microelectronic Engineering
·
20
Electrical simulation of gold bonding wire with different parameters
2015
·
Dejing Wang
, Yuanfu Zhao
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
15
Microstructure and Mechanical Properties of In-Doped Low-Temperature SnPb Solders
2025
·
Xiaochen Xie
, Pengrong Lin
, et al.
·
Materials
·
12
PDF
A multi-step etch method for fabricating slightly tapered through-silicon vias based on modified Bosch process
2018
·
Pengrong Lin
, Xiaochen Xie
, et al.
·
Microsystem Technologies
·
11
Effect of temperature cycling on reliability of flip chip solder joint
2014
·
Xueming Jiang
, Pengrong Lin
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
7
The Study for Thermal Analysis Technology of Three-Dimension SRAM Component
2007
·
Yusheng Cao
, Tong Jiang
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
6
The influence of the solder joint void on the CCGA package reliability
2014
·
Yingzhuo Huang
, Binhao Lian
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
4
Reliability study of the solder joints in CCGA package during thermal test
2014
·
Xiaorui Lv
, Yingzhuo Huang
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
4
Simulation of bonding wire deformation in random vibration
2013
·
Peifeng Hu
, Yusheng Cao
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
4
The Study for Thermal Analysis Technology of Three-Dimension SRAM Component
2007
·
Yusheng Cao
, Tong Jiang
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
4
Study on the electrical performance of Au bump in FC ceramic package
2017
·
Feng Lu
, Peifeng Hu
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
2
The reliability of high-lead solder joints in flip-chip devices
2014
·
Lingjuan Tian
, Yuanfu Zhao
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
2
Research of surface wettability of plating on the ceramic shell
2014
·
Dongmei Li
, Xiaocheng Feng
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
2
Study on the electrical performance of one differential pair bonding fingers on different layers in wire bonding package
2016
·
Feng Lu
, Yusheng Cao
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
1
The finite element analysis on reliability of gold bump
2016
·
Jiansong Liu
, Quanbin Yao
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
1
Study on Electrical Performance of FC and WB in IC Ceramic Package
2016
·
Dejing Wang
, Yuanfu Zhao
, et al.
·
International Conference on Materials Engineering, Manufacturing Technology and Control (ICMEMTC)
·
1
PDF
Design and simulation of CCGA AlN ceramic package
2015
·
Feng Lu
, Zhijie Deng
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
1
Effect of Cu on interfacial reaction in high-lead solder bumps
2015
·
Liwei Xu
, Mingliang Huang
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
1
The study on grinding process of flip chip wafers
2013
·
Xiaobo Zhuang
, Binhao Lian
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
1
The Mechanical Analysis of Sn-Base Bump
2019
·
Jun Yang
, Quanbin Yao
, et al.
·
IOP Conference Series Materials Science and Engineering
PDF
Researchon Mechanical Behavior of Through silicon via of 2.5D Interposer
2018
·
Jun Yang
, Quanbin Yao
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
The effects of Au film thickness on the reliability of Sn-Pb solder joints
2015
·
Xiaorui Lv
, Pengrong Lin
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
Research on the impact of heat treatment on coating quality and reliability of welding after plating nickel
2015
·
Dongmei Li
, Jinchun He
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
The reliability of high-lead solder joints in flip-chip devices
2014
·
Lingjuan Tian
, Yuanfu Zhao
, et al.
·
IEEE International Symposium on Applications of Ferroelectrics (ISAF)
Research of surface wettability of plating on the ceramic shell
2014
·
Dongmei Li
, Xiaocheng Feng
, et al.
·
IEEE International Symposium on Applications of Ferroelectrics (ISAF)
Show more works
View as search
Works count:
31
Citation count:
99
H-index:
6
I10-index:
4
Year
Topic
Type