Author

B. Pouderoux

Observed names: Pouderoux, B., Pouderoux, Betrtand

Observed institutions: Normandie Université, Laboratoire Universitaire des Sciences Appliquées de Cherbourg, Université de Caen Normandie

OpenAlex ID: A5038045140

Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition

2010 · A. Oukaour, B. Tala-Ighil, et al. · Microelectronics Reliability · 46

Analysis of Commercial Punch-Through IGBTs Behavior Under $^{60}$Co Irradiation: Turn-Off Switching Performances Evolution

2012 · B. Tala-Ighil, A. Oukaour, et al. · IEEE Transactions on Nuclear Science · 9

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour

2011 · B. Tala-Ighil, A. Oukaour, et al. · Microelectronics Reliability · 5

Optical Flow Measuring Apparatus and Inhalation Apparatus Comprising the Same

2017 · Verjus, Romuald, Poree, Thierry, et al. · HAL

PWM power cycling test for IGBT modules operating at ambient temperature

2012 · Tounsi, Mohamed, Oukaour, Amrane, et al. · HAL

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour

2011 · Boubekeur, Tala-Ighil, Oukaour, Amrane, et al. · HAL

Works count: 6

Citation count: 60

H-index: 3

I10-index: 1