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Myeong-Cheol Shin

Observed names: Myeong Cheol Shin, Myeong-cheol Shin
ORCID: 0000-0002-1265-9983
Observed ORCID: 0000-0002-1265-9983
OpenAlex ID: A5038305700
High-Performance Temperature Sensors Based on Dual 4H-SiC JBS and SBD Devices
2020 · Seong-Ji Min, Myeong Cheol Shin, et al. · Materials · 24
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Improved Electrical Characteristics of Gallium Oxide/P-Epi Silicon Carbide Static Induction Transistors with UV/Ozone Treatment Fabricated by RF Sputter
2021 · Myeong-Cheol Shin, Young-Jae Lee, et al. · Materials · 10
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Influence of Gas Annealing on Sensitivity of AlN/4H-SiC-Based Temperature Sensors
2021 · Seung-Woo Jung, Myeong-Cheol Shin, et al. · Materials · 10
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Bandgap modulation and electrical characteristics of (AlxGa1−)2O3/4H-SiC thin film heterostructures
2022 · Hee-Jae Lee, Myeong-Cheol Shin, et al. · Thin Solid Films · 5
Effect of nitrogen and oxygen annealing on (Al0.1Ga0.9)2O3/4H-SiC heterojunction diodes
2022 · Soo-Young Moon, Seung-Woo Jung, et al. · Thin Solid Films · 5
Modeling and investigation of the effect of annealing on the electrothermal properties of Ga2O3/SiC heterojunction diodes
2022 · Min-Yeong Kim, Hee-Jae Lee, et al. · Thin Solid Films · 4
Growth of hexagonal-shape Si on a 4H–SiC substrate by mixed-source hydride vapor phase epitaxy
2023 · Seonwoo Park, Suhyun Mun, et al. · Journal of the Korean Physical Society · 3
Effect of Post Annealing on the Electrical Characteristics and Deep Level Defects of Ga2O3/SiC Heterojunction Diodes
2022 · Dong-Wook Byun, Min-Yeong Kim, et al. · European Solid-State Device Research Conference · 3
Study on 3.3 kV Super Junction Field Stop Insulated Gate Bipolar Transistor According to Design and Process Parameters
2018 · Myeong Cheol Shin, Hun-Suk Chung, et al. · Journal of Nanoscience and Nanotechnology · 3
Temperature Sensors Based on AlN/4H-SiC Diodes
2021 · Myeong-Cheol Shin, Dong-Hyeon Kim, et al. · Science of Advanced Materials · 1
Al Implantation and Post Annealing Effects in n-Type 4H-SiC
2020 · Woo-Young Son, Myeong-Cheol Shin, et al. · Journal of Nanoelectronics and Optoelectronics · 1
Study on the Electrical Characteristics of 600 V Trench Gate IGBT with Single N+ Emitter
2019 · Myeong Cheol Shin, Jinkeoung Yuek, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers · 1
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Realization of a 2H–Si microneedle with an ultrafast growth rate of 6.7 × 104 Å·s−1
2025 · Suhyun Mun, Kyoung Hwa Kim, et al. · Semiconductor Science and Technology
Realization of a 2H–Si microneedle with an ultrafast growth rate of 6.7 × 104 Å·s-1
2025 · Suhyun Mun, Kyoung Hwa Kim, et al. · Semiconductor Science and Technology
Advanced HVPE sublimation sandwich method for Si layer formation on SiC substrates
2024 · Seonwoo Park, Kyoung Hwa Kim, et al. · Journal of the Korean Physical Society
HVPE growth of Si crystal with topological chiral morphology
2024 · Suhyun Mun, Seonwoo Park, et al. · Journal of the Korean Physical Society
Properties of Si-AlN Core-Shell Microcrystals by Al-Based Nanostructures
2024 · Suhyun Mun, Seonwoo Park, et al. · New Physics Sae Mulli
Electrical Characterization of Lateral NiO/Ga2O3 FETs with Heterojunction Gate Structure
2023 · Geon-hee Lee, Soo-young Moon, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
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Self-Heating Effects in β-Ga2O3/4H-SiC MESFETs
2022 · Min-yeong Kim, Hyun-su Seo, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
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실리콘에 Local Anodic Oxidation으로 만든 산화물의 영향
2021 · Seung Woo Jung, Dong-Wook Byun, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
Influence of Oxide Fabricated by Local Anodic Oxidation in Silicon
2021 · Seung-woo Jung, Dong-wook Byun, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
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Deep Level Defect Transient Spectroscopy Analysis of 4H-SiC SBD and JBS Diodes
2021 · Dong-wook Byun, Myeong-cheol Shin, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
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600 V급 IGBT Single N+ Emitter Trench Gate 구조에 따른 전기적 특성
2019 · Myeong-Cheol Shin, Jinkyoung Youk, et al. · Journal of the Korean Institute of Electrical and Electronic Material Engineers
Works count: 23
Citation count: 70
H-index: 5
I10-index: 3
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