Author

Martin Streibl

Observed names: M. Streibl, Streibl, Martin 1969-
OpenAlex ID: A5038405184
1999 · W. Sauer, M. Streibl, et al. · Applied Physics Letters · 86
1999 · M. Streibl, A. Wixforth, et al. · Applied Physics Letters · 38
2006 · W. Soldner, M. Streibl, et al. · Microelectronics Reliability · 33
1999 · A.M. Song, S. Manus, et al. · Superlattices and Microstructures · 23
2004 · S. Bargstädt-Franke, W. Stadler, et al. · Microelectronics Reliability · 20
2005 · R. Salerno, M. Tiebout, et al. · European Solid-State Circuits Conference (ESSCIRC) · 18
2004 · M. Streibl, F. Zängl, et al. · Microelectronics Reliability · 15
2004 · K. Domanski, S. Bargstadt-Franke, et al. · IEEE International Reliability Physics Symposium proceedings · 14
2002 · M. Streibl, Kai Esmark, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
2007 · Wolfgang Soldner, Moon-Jung Kim, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 11
2007 · Ulrich Glaser, Kai Esmark, et al. · Microelectronics Reliability · 10
2003 · M. Streibl, K. Esmark, et al. · Microelectronics Reliability · 8
2007 · Zheng Gu, Peter Gregorius, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 7
2004 · U. Glaser, J. Schneider, et al. · IEEE International Reliability Physics Symposium proceedings · 6
2002 · M. Streibl, H.-J. Kutschera, et al. · IEEE International Ultrasonics Symposium · 5
2002 · W. Stadler, K. Esmark, et al. · Microelectronics Reliability · 5
2004 · S. Druen, M. Streibl, et al. · IEEE International Reliability Physics Symposium proceedings · 4
2000 · M. Streibl, A. Wixforth, et al. · Physica E Low-dimensional Systems and Nanostructures · 3
1998 · Petra Denk, Martin Hartung, et al. · Physical review. B, Condensed matter · 3
1999 · M. Streibl, F. Beil, et al. · IEEE International Ultrasonics Symposium · 2
1999 · W. Sauer, M. Streibl, et al. · IEEE International Ultrasonics Symposium · 2
2002 · C. Bodefeld, F. Beil, et al. · IEEE International Ultrasonics Symposium · 1
2004 · Stephan Druen, Martin Streibl, et al. · Electrical Overstress/Electrostatic Discharge Symposium
2002 · M. Streibl, C. Rocke, et al. · Proceedings/Proceedings - IEEE Ultrasonics Symposium
Works count: 28
Citation count: 331
H-index: 10
I10-index: 11
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