Author

Johan J. T. M. Donkers

Observed names: Donkers J J T M, Donkers, J. J. T. M., J. Donkers, J. J. T. M Donkers, J. J. T. M. Donkers, J.J.T.M Donkers, J.J.T.M. Donkers, Johan Donkers, Johan J.T.M. Donkers
Institution: NXP (Germany)
OpenAlex ID: A5041875981
1999 · T. Hibma, F. C. Voogt, et al. · Journal of Applied Physics · 138
1998 · Jeroen Huijbregtse, Fred Roozeboom, et al. · Journal of Applied Physics · 66
1993 · L.H.M. Krings, E.E. Havinga, et al. · Synthetic Metals · 59
1998 · J.J. Van Den Broek, J.J.T.M. Donkers, et al. · Philips Journal of Research · 42
1998 · O. Pyper, R. Schöllhorn, et al. · Materials Research Bulletin · 36
2017 · William M. Waller, Mark Gajda, et al. · IEEE Transactions on Electron Devices · 35
2017 · William M. Waller, Mark Gajda, et al. · IEEE Transactions on Electron Devices · 35
2015 · J. A. Croon, G. A. M. Hurkx, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 34
2014 · M. Hajłasz, J. J. T. M. Donkers, et al. · Applied Physics Letters · 31
1997 · K.-M. H. Lenssen, A. E. M. De Veirman, et al. · Journal of Applied Physics · 31
2009 · D. Stephens, T. Vanhoucke, et al. · Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium · 23
2007 · J.J.T.M. Donkers, T. Vanhoucke, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 23
2002 · P. Deixler, H.G.A. Huizing, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 17
2005 · J.J.T.M. Donkers, T. Vanhoucke, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 15
1998 · F. Roozeboom, P.J.H. Bloemen, et al. · Philips Journal of Research · 15
2011 · P.H.C. Magnee, R. van Dalen, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 12
2015 · M. Hajlasz, J. J. T. M. Donkers, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 11
1996 · K.-M.H. Lenssen, J.C.S. Kools, et al. · Journal of Magnetism and Magnetic Materials · 11
2007 · L.J. Choi, S. Van Huylenbroeck, et al. · IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) · 10
2004 · M. A. Verheijen, J. J. T. M. Donkers, et al. · Review of Scientific Instruments · 10
2017 · Marcin Hajlasz, Johan J. T. M. Donkers, et al. · IEEE Transactions on Electron Devices · 6
2016 · J. A. Croon, G. A. M. Hurkx, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 6
2010 · T. Vanhoucke, J.J.T.M. Donkers, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 5
Works count: 42
Citation count: 789
H-index: 15
I10-index: 22
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