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Hugh Gotts
Observed names:
Gotts, Hugh E.,
H Gotts,
H.E. Gotts,
Hugh E Gotts,
Hugh E. Gotts
Institution:
Air Liquide (United States)
Observed institutions:
Analytical Services,
Air Liquide (United States)
OpenAlex ID:
A5043220719
A systematic study of a-CN/sub x/ overcoat film for proximity recording
1997
·
Bing Zhang
, Bo Wei
, et al.
·
IEEE Transactions on Magnetics
·
21
Analytical Characterization of ALD Thin Film Precursors
2010
·
Phil Clancy
, Lisa S. Milstein
, et al.
·
ECS Transactions
·
4
PDF
Contamination Troubleshooting for Microelectronics Packaging
2021
·
Victor K.F. Chia
, Tiffany Wilkus
, et al.
·
International Symposium on Microelectronics
·
2
PDF
FTIR analysis of printed-circuit board residue
1996
·
Sharon A. Myers
, Troy D. Cognata
, et al.
·
Proceedings annual meeting Electron Microscopy Society of America
·
1
Development of an ultra-clean sample heating stage for thermal desorption spectroscopy
2024
·
Xiaoyu Zou
, Matthew Fisher
, et al.
·
Microelectronic Engineering
Contamination Troubleshooting Approach from Problem to Solution
2019
·
Victor K. F. Chia
, Hugh E. Gotts
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Inductively Coupled Plasma Mass Spectrometry
2019
·
Li, Fuhe
, Gotts, Hugh E.
·
ASM International eBooks
Cold-container crystal growth of “last-to-freeze” silicon samples, and enhanced detection of metallic impurities by ICP-MS
2014
·
T.F. Ciszek
, Hugh E. Gotts
·
Conference record of the IEEE Photovoltaic Specialists Conference
Sampling and Analysis of Boron Tribromide for Trace Metal Contaminants
2013
·
Phillip L Clancy
, Dan Cowles
, et al.
·
ECS Meeting Abstracts
PDF
Analytical Characterization of Silicon-Based CVD Precursor Compounds and Reactive Gases
2011
·
Phillip L. Clancy
, Dan Cowles
, et al.
·
ECS Meeting Abstracts
PDF
Analytical Characterization of ALD Thin Film Precursors
2010
·
Lisa S. Milstein
, Phil Clancy
, et al.
·
ECS Meeting Abstracts
PDF
Evaluation of the Effects of Impurities in Precursor Materials on the Function of Semiconductor Circuits
2009
·
Phillip L. Clancy
, Hugh E. Gotts
·
ECS Meeting Abstracts
PDF
Characterization of Process Induced Contamination and Residues on Semiconductor Components Via FTIR and Raman Microanalysis
2001
·
H Gotts
·
Microscopy and Microanalysis
Semiconductor Thin Film Characterization Via Raman Microprobe Spectroscopy: Analysis At The Process Line
1999
·
Hugh E Gotts
·
Microscopy and Microanalysis
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Works count:
14
Citation count:
28
H-index:
2
I10-index:
1
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