Work

Cold-container crystal growth of “last-to-freeze” silicon samples, and enhanced detection of metallic impurities by ICP-MS

Year: 2014

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc.2014.6925555

Authors: T.F. Ciszek, Hugh E. Gotts

Language: English

Topic: Analytical chemistry methods development

Subfield: Analytical Chemistry

Field: Chemistry

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2020299233

FWCI:

Cites: 6

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Related to: 10