Author

Jaime Calçade Rodrigues

Observed names: Jaime C. Rodrigues, Jaime Calcade Rodrigues, Jaime CalÇade Rodrigues, Jaime Rodrigues

Institution: Centro Universitário FEI

Observed institution: Centro Universitário FEI

ORCID: 0000-0002-3731-2206

Observed ORCID: 0000-0002-3731-2206

OpenAlex ID: A5046096718

Analysis of electron mobility in 7-level stacked nanosheet GAA nMOSFETs

2025 · Michelly de Souza, Jaime Calçade Rodrigues, et al. · Solid-State Electronics · 7

Experimental Evaluation of 7-Level Stacked Nanosheet SOI MOSFETs Analog Parameters

2024 · Michelly De Souza, Jaime Calçade Rodrigues, et al. · 7

Electrical characterization of stacked SOI nanowires at low temperatures

2022 · Jaime C. Rodrigues, Genaro Mariniello, et al. · Solid-State Electronics · 6

Experimental extraction of self-heating in SOI nanowire MOSFETs at cryogenic temperatures

2025 · Flavio Enrico Bergamaschi, Jefferson Almeida Matos, et al. · Solid-State Electronics · 3

Temperature Influence on the Electrical Properties of Vertically Stacked Nanowire MOSFETs

2021 · Jaime C. Rodrigues, Genaro Mariniello, et al. · Symposium on Microelectronics Technology and Devices · 3

Low-field Mobility Degradation Factors Temperature Dependence in Two-level Stacked Nanowire MOSFETs from 120K to 400K

2023 · Jaime Calçade Rodrigues, Mikael Cassé, et al. · Symposium on Microelectronics Technology and Devices · 1

Modeling of silicon stacked nanowire and nanosheet transistors at high temperatures

2022 · Antonio Cerdeira, Magali Estrada, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 1

An Experimental Evaluation of Fin Width and Low-Temperature Influence on GIDL in Stacked SOI Nanowires

2022 · Michelly de Souza, Jaime Calcade Rodrigues, et al. · IEEE Workshop on Low Temperature Electronics (WOLTE) · 1

Experimental Decomposition of the Carrier Mobility in the Conduction Planes of 2-Level Stacked Nanowires

2024 · Giovanni Almeida Matos, Jaime CalÇade Rodrigues, et al. · International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)

Influence of Extraction Methods on the Threshold Voltage Variability Results in SOI Nanosheets

2024 · Vinícius Rodrigues Prates, Jaime Calçade Rodrigues, et al. · Symposium on Microelectronics Technology and Devices

Two-level Stacked Nanowire MOSFETs: A Low Temperature Analysis of the Low-Field Mobility Degradation Factors

2024 · Jaime Calçade Rodrigues, Mikael Cassé, et al. · Journal of Integrated Circuits and Systems

Caracterização elétrica de transistores mos do tipo nanofio e nanofolha de sílicio empilhado emTemperaturas criogênicas

2023 · Jaime Rodrigues

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Performance of Stacked SOI Nanowires in a Wide Temperature Range

2021 · Jaime C. Rodrigues, Genaro Mariniello, et al. · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon

Works count: 13

Citation count: 29

H-index: 3

I10-index: