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Olivier Héron

On the reliability evaluation of sram-based FPGA designs
2005 · O. Heron, T. Arnaout, et al. · International Conference on Field Programmable Logic and Applications (FPL) · 34
Defect analysis for delay-fault BIST in FPGAs
2004 · P. Girard, O. Heron, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 18
High Quality TPG for Delay Faults in Look-Up Tables of FPGAs
2005 · P. Girard, O. Heron, et al. · IEEE International Workshop on Electronic Design, Test and Applications (DELTA) · 15
An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs
2006 · Patrick Girard, Olivier Héron, et al. · Journal of Electronic Testing · 14
Impact of the application activity on intermittent faults in embedded systems
2011 · Julien Guilhemsang, Olivier Heron, et al. · IEEE VLSI Test Symposium (VTS) · 13
Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies
2010 · O. Heron, J. Guilhemsang, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 11
BIST of delay faults in the logic architecture of symmetrical FPGAs
2004 · Patrick Girard, Olivier Héron, et al. · 10
BIST of delay faults in the logic architecture of symmetrical FPGAs
2004 · P. Girard, O. Heron, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 8
Requirements for delay testing of look-up tables in SRAM-based FPGAs
2004 · P. Girard, O. Heron, et al. · IEEE European Test Symposium (ETS) · 8
Modeling and Deployment of Model-Based Decentralized Embedded Diagnosis inside Vehicles: Application to Smart Distance Keeping Function
2012 · Othman Nasri, Hassan Shraim, et al. · International Journal of Vehicular Technology · 7
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High Level Power and Energy Exploration Using ArchC
2010 · T. Gupta, C. Bertolini, et al. · International Symposium on Computer Architecture and High Performance Computing (SBAC-PAD) · 7
When processors get old: Evaluation of BTI and HCI effects on performance and reliability
2013 · Chiara Sandionigi, Olivier Heron, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 4
Relation between HCI-induced performance degradation and applications in a RISC processor
2012 · C. Bertolini, O. Heron, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 4
Towards on-line estimation of BTI/HCI-induced frequency degradation
2017 · M. Altieri, S. Lesecq, et al. · IEEE International Reliability Physics Symposium proceedings · 3
Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor
2015 · Mauricio Altieri, Suzanne Lesecq, et al. · International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) · 3
Workload-dependent BTI analysis in a processor core at high level
2015 · O. Heron, C. Sandionigi, et al. · IEEE International Reliability Physics Symposium proceedings · 3
Impact of Power Consumption and Temperature on Processor Lifetime Reliability
2012 · Tushar Gupta, Clement Bertolini, et al. · Journal of Low Power Electronics · 3
RAAPS: Reliability Aware ArchC based Processor Simulator
2010 · T. Gupta, C. Bertolini, et al. · IEEE International Integrated Reliability Workshop final report · 3
Effects of various applications on relative lifetime of processor cores
2009 · T. Gupta, C. Bertolini, et al. · IEEE International Integrated Reliability Workshop final report · 3
Manufacturing-oriented testing of delay faults in the logic architecture of symmetrical FPGAs
2004 · P. Girard, O. Heron, et al. · IEEE European Test Symposium (ETS) · 3
Towards Privacy-first Manufacturing Data Exchange Platform
2023 · Thanh-Hai Nguyen, Olivier Heron, et al. · International Symposium on Information and Communication Technology · 2
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Identifying aging-aware representative paths in processors
2015 · Chiara Sandionigi, Olivier Heron · IEEE International On-Line Testing Symposium (IOLTS) · 2
Smart Distance Keeping: Modeling and Perspectives for Embedded Diagnosis
2010 · Hassan Shraim, Othman Nasri, et al. · International Conference on Intelligent Systems, Modelling and Simulation · 2
Estimation of oxide breakdown effects by fault injection
2019 · Chiara Sandionigi, Olivier Heron · IEEE International On-Line Testing Symposium (IOLTS) · 1
Fine-grain analysis of the parameters involved in aging of digital circuits
2016 · Boukary Ouattara, Olivier Heron, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 1
Works count: 47
Citation count: 186
H-index: 8
I10-index: 7
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