Author

D. Shum

1989 · C. Benelli, A. Caneschi, et al. · Inorganic Chemistry · 122
2018 · D. J. J. Loy, P. A. Dananjaya, et al. · Scientific Reports · 55
2017 · D. Shum, D. Houssameddine, et al. · Symposium on VLSI Technology · 50
2016 · J. M. Slaughter, K. Nagel, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 38
2018 · K. Lee, K. Yamane, et al. · Symposium on VLSI Technology · 37
2006 · M. Ieong, J. Sudijono, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 25
2009 · R. Pullela, S. Tadjpour, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 24
2002 · R. Mih, J. Harrington, et al. · Symposium on VLSI Technology · 24
2017 · Danny Shum, Lai Q. Luo, et al. · IEEE International Memory Workshop (IMW) · 22
2007 · Kyung Joon Han, Martin Stiftinger, et al. · IEEE International Memory Workshop (IMW) · 20
2018 · S. Agarwal, H. Dixit, et al. · IEEE International Magnetics Conference · 14
2018 · Bharat Bhushan, Lim Teck Guan, et al. · IEEE International Memory Workshop (IMW) · 11
1987 · K.W. Ng, Z.G. Khim, et al. · Surface Science · 11
2007 · Kyung Joon Han, Nigel Chan, et al. · Custom Integrated Circuits Conference · 10
2007 · Armin T. Tilke, Laura Pescini, et al. · IEEE Transactions on Electron Devices · 9
2002 · D. Shum · IEEE International Conference on ASIC (ASICON) · 9
2002 · D.P. Shum, C.T. Swift, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 8
2018 · F N Tan, G J Lim, et al. · Journal of Physics D Applied Physics · 7
2017 · J.M. Slaughter, K. Nagel, et al. · IEEE International Magnetics Conference · 7
Works count: 57
Citation count: 700
H-index: 14
I10-index: 19
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