Author

P. Zuliani

2004 · F. Pellizzer, A. Pirovano, et al. · Symposium on VLSI Technology · 199
2013 · Paola Zuliani, Enrico Varesi, et al. · IEEE Transactions on Electron Devices · 153
2010 · Luca Perniola, Veronique Sousa, et al. · IEEE Electron Device Letters · 151
2020 · Paolo Cappelletti, Roberto Annunziata, et al. · Journal of Physics D Applied Physics · 122
2011 · G. Betti Beneventi, L. Perniola, et al. · Solid-State Electronics · 109
2018 · F. Arnaud, P. Zuliani, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 95
2015 · Paola Zuliani, Elisabetta Palumbo, et al. · Solid-State Electronics · 78
2013 · G. Navarro, M. Coue, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 76
2010 · Guid De Sandre, Luca Bettini, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 73
2009 · R. Annunziata, P. Zuliani, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 70
1995 · P. Zuliani, M. Del Zoppo, et al. · The Journal of Chemical Physics · 69
2014 · Nicola Ciocchini, Elisabetta Palumbo, et al. · IEEE Transactions on Electron Devices · 56
2020 · F. Arnaud, P. Ferreira, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 54
1995 · P. Zuliani, M. Del Zoppo, et al. · The Journal of Physical Chemistry · 45
2017 · Elisabetta Palumbo, Paola Zuliani, et al. · Solid-State Electronics · 44
2012 · Q. Hubert, C. Jahan, et al. · IEEE International Memory Workshop (IMW) · 42
2013 · G. Navarro, V. Sousa, et al. · Solid-State Electronics · 35
2010 · Guido De Sandre, Luca Bettini, et al. · IEEE Journal of Solid-State Circuits · 35
1998 · M. Del Zoppo, C. Castiglioni, et al. · Journal of the Optical Society of America B · 32
2016 · G. Navarro, V. Sousa, et al. · IEEE International Memory Workshop (IMW) · 30
2004 · F. Ottogalli, A. Pirovano, et al. · European Solid-State Circuits Conference (ESSCIRC) · 28
2020 · M. Baldo, O. Melnic, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 21
Works count: 68
Citation count: 2,045
H-index: 24
I10-index: 38
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