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Arka Halder

Observed names: A. Halder, Halder, Arka
ORCID: 0000-0002-4809-4902
Observed ORCID: 0000-0002-4809-4902
OpenAlex ID: A5049900415
28-nm FD-SOI CMOS RF Figures of Merit Down to 4.2 K
2020 · Lucas Nyssens, Arka Halder, et al. · IEEE Journal of the Electron Devices Society · 40
On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET
2021 · Lucas Nyssens, M. Rack, et al. · IEEE Electron Device Letters · 19
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Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications
2021 · Valeriya Kilchytska, Sergej Makovejev, et al. · IEEE Journal of the Electron Devices Society · 19
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Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperatures and its Effect on Analog Figures of Merit
2020 · Lucas Nyssens, Arka Halder, et al. · IEEE Journal of the Electron Devices Society · 19
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Self-Heating in 28 FDSOI UTBB MOSFETs at Cryogenic Temperatures
2019 · Lucas Nyssens, Arka Halder, et al. · European Solid-State Device Research Conference · 8
Heat sink implementation in back-end of line for self-heating reduction in 22 nm FDSOI MOSFETs
2021 · Arka Halder, Lucas Nyssens, et al. · Solid-State Electronics · 7
28 FDSOI RF Figures of Merit down to 4.2 K
2019 · L. Nyssens, A. Halder, et al. · IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference · 7
Impact of High Temperature Up to 175 °C on the DC and RF Performances of 22-nm FD-SOI MOSFETs
2023 · Arka Halder, Lucas Nyssens, et al. · IEEE Transactions on Electron Devices · 5
22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C
2022 · Arka Halder, Lucas Nyssens, et al. · IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) · 5
Effect of Heat Sink in Back-End of Line on Self-Heating in 22 nm FDSOI MOSFETs
2020 · Arka Halder, Lucas Nyssens, et al. · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon · 4
Moment based delay modelling for on-chip RC global VLSI interconnect for unit ramp input
2012 · Arka Halder, Vikas Maheshwari, et al. · International Joint Conference on Computer Science and Software Engineering · 3
Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs
2023 · Arka Halder, Lucas Nyssens, et al. · Solid-State Electronics · 2
Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI
2021 · Lucas Nyssens, Martin Rack, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 1
Electrical characterization of advanced MOSFETs towards analog and RF applications
2020 · Valeriya Kilchytska, Sergej Makovejev, et al. · IEEE Latin American Electron Devices Conference (LAEDC) · 1
Energy Efficient 1-T Relaxation Oscillator Demonstrated Through 22-nm FD-SOI Technology
2025 · V Rajakumari, Aravind Ananthakrishnan, et al. · IEEE Electron Device Letters
Impact of Device Layout on Self-Heating Extraction in MOSFETs
2025 · Arka Halder, Martin Vanbrabant, et al. · Solid-State Electronics
Works count: 19
Citation count: 140
H-index: 7
I10-index: 4
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