Author

S. Max

Observed names: Solomon M Max, Solomon Max

Observed institution: University of Sannio

OpenAlex ID: A5053602421

ADC parameters and characteristics

2005 · S. Rapuano, P. Daponte, et al. · IEEE Instrumentation & Measurement Magazine · 72

Fast accurate and complete ADC testing

2003 · S. Max · IEEE International Test Conference (ITC) · 52

Testing high speed high accuracy analog to digital converters embedded in systems on a chip

2003 · S. Max · IEEE International Test Conference (ITC) · 31

ADC testing - Part 7 in a series of tutorials in Instrumentation and Measurements

2006 · T.E. Linnenbrink, J. Blair, et al. · IEEE Instrumentation & Measurement Magazine · 26

Ramp testing of ADC transition levels using finite resolution ramps

2002 · S. Max · IEEE International Test Conference (ITC) · 20

Optimum measurement of ADC code transitions using a feedback loop

2003 · S. Max · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 18

Analysis and measurement of timing jitter induced by radiated emi noise in automatic test equipment

2003 · Y.J. Lee, T. Kane, et al. · IEEE Transactions on Instrumentation and Measurement · 14

Measuring the Timing Jitter of ATE in the Frequency Domain

2006 · L. Schiano, M. Momenzadeh, et al. · IEEE Transactions on Instrumentation and Measurement · 10

IEEE Std 1241: the benefits and risks of ADC histogram testing

2002 · S. Max · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 9

Optimum DAC and ADC Testing

2008 · Solomon Max · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 8

Four parameter sine fit with less than one cycle of data

2004 · S. Max · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 7

Direct AWG sine wave synthesis with fixed clock frequency

2002 · S. Max · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 5

Direct AWG sine wave synthesis with fixed clock frequency

2002 · Solomon Max · Measurement · 5

Enhanced ADC sine wave histogram test

2015 · Solomon Max, Richard Liggiero · IEEE International Instrumentation and Measurement Technology Conference · 3

Reducing THD in an audio test instrument

2012 · Solomon Max, Richard Liggiero · IEEE International Instrumentation and Measurement Technology Conference · 3

Frequency domain measurement of timing jitter in ATE

2004 · L. Schiano, M. Momenzadeh, et al. · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 3

Testing pass-band response and group delay of filters in system on a chip

2003 · S. Max · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 2

Extending calibration intervals

2002 · S. Max · IEEE International Test Conference (ITC) · 2

Ensuring system traceability to international standards

2002 · S. Max · IEEE International Test Conference (ITC) · 2

The INL verification puzzle

2010 · David Leip, Dennis Lia, et al. · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 1

Visualizing quality

2002 · S. Max · IEEE International Test Conference (ITC) · 1

ADC test development tool kit

2012 · Richard Liggiero, Kenneth Donovan, et al. · IEEE International Instrumentation and Measurement Technology Conference

“IEEE 1241 draft standard for terminology and test methods for analog-to-digital converters”

2008 · S.J. Tilden, S. Max, et al.

A digital and wide power bandwidth H-field generator for automatic test equipment

2004 · Fengming Zhang, Y.J. Lee, et al. · IEEE Symposium on Computer Arithmetic (ARITH)

When "almost" is good enough: a fresh look at DSP clock rates

2002 · E. Rosenfeld, S. Max · IEEE International Test Conference (ITC)

Works count: 25

Citation count: 294

H-index: 9

I10-index: 8