Work

ADC test development tool kit

Year: 2012

Type: conference-paper

Source: IEEE International Instrumentation and Measurement Technology Conference

DOI: 10.1109/i2mtc.2012.6229416

Authors: Richard Liggiero, Kenneth Donovan, Solomon M Max, Steven Tilden

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1992154142

FWCI:

Cites: 3

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Related to: 10