VLSI and Analog Circuit Testing
Description: This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.
Characteristic keywords: built-in self-test, fault coverage, design for testability, integrated circuit testing, test pattern generation, stuck-at faults, fault simulation, testability, automatic test pattern generation, VLSI testing, test time reduction, digital circuit testing, combinational circuits, test cost reduction, memory assessment, scan-based testing, sequential circuits, analog circuit testing, system-on-chip testing, test data compression, boundary scan, scan chain, IDDQ testing, automatic test equipment, fault models
Sibling topics: Parallel Computing and Optimization Techniques, Embedded Systems Design Techniques, Real-Time Systems Scheduling, Physical Unclonable Functions (PUFs) and Hardware Security, Network Packet Processing and Optimization, Cloud Computing and Remote Desktop Technologies, Energy Efficiency in Computing
Parent subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
OpenAlex ID: T11032