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Keyword

scan-based testing

Description: A digital circuit testing method that uses scan chains to control and observe internal states, enabling fault detection in integrated circuits.
OpenAlex ID: keywords/scan-testing
Embedded Deterministic Test
2004 · J. Rajski, J. Tyszer, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 527
Survey of Test Vector Compression Techniques
2006 · N.A. Touba · IEEE Design & Test of Computers · 439
Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
1995 · S. Hellebrand, J. Rajski, et al. · IEEE Transactions on Computers · 408
Embedded deterministic test for low cost manufacturing test
2003 · J. Rajski, J. Tyszer, et al. · Proceedings/Proceedings - International Test Conference · 402
Static compaction techniques to control scan vector power dissipation
2002 · R. Sankaralingam, R.R. Oruganti, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 354
OPMISR: the foundation for compressed ATPG vectors
2002 · C. Barnhart, V. Brunkhorst, et al. · Proceedings/Proceedings - International Test Conference · 343
Test vector decompression via cyclical scan chains and its application to testing core-based designs
2002 · A. Jas, N.A. Touba · Proceedings/Proceedings - International Test Conference · 275
Minimizing power consumption in scan testing: pattern generation and DFT techniques
2005 · K.M. Butler, J. Saxena, et al. · 274
Compactest: a Method to Generate Compact Test Sets for Combinational Circuits
2005 · I. Pomeranz, L.N. Reddy, et al. · Proceedings/Proceedings - International Test Conference · 261
Clinical Features and Survivial of Cirrhotic Patients With Subclinical Cognitive Alterations Detected by the Number Connection Test and Computerized Psychometric Tests
1999 · Piero Amodio, Franco Del Piccolo, et al. · Hepatology · 251
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Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs
2006 · Santiago Remersaro, Xijiang Lin, et al. · Proceedings/Proceedings - International Test Conference · 239
FRITS - a microprocessor functional BIST method
2003 · P. Parvathala, K. Maneparambil, et al. · Proceedings/Proceedings - International Test Conference · 238
Test volume and application time reduction through scan chain concealment
2001 · Ismet Bayraktaroglu, Alex Orailoglu · Proceedings - ACM IEEE Design Automation Conference · 220
Bit-flipping BIST
1996 · Hans-Joachim Wunderlich, Gundolf Kiefer · International Conference on Computer Aided Design · 208
Bit-flipping BIST
2002 · H.-J. Wunderlich, G. Kiefer · International Conference on Computer Aided Design · 176
The Effect of Different Test Sets on Quality Level Prediction: When Is 80% Better Than 90%?
2005 · P.C. Maxwell, R.C. Aitken, et al. · Proceedings/Proceedings - International Test Conference · 174
Securing Designs against Scan-Based Side-Channel Attacks
2007 · J. Lee, M. Tehranipoor, et al. · IEEE Transactions on Dependable and Secure Computing · 173
An analysis of power reduction techniques in scan testing
2002 · J. Saxena, K.M. Butler, et al. · Proceedings/Proceedings - International Test Conference · 166
Design for Testability Using Scanpath Techniques for Path-delay Test and Measurement
2005 · B.I. Dervisoglu, G.E. Stong · Proceedings/Proceedings - International Test Conference · 165
On low-capture-power test generation for scan testing
2005 · Xiaoqing Wen, Y. Yamashita, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 164
A unified approach to reduce soc test data volume, scan power and testing time
2003 · A. Chandra, K. Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 162
Reducing power dissipation during test using scan chain disable
2002 · R. Sankaralingam, B. Pouya, et al. · 149
IDDQ and AC scan: the war against unmodelled defects
2002 · P.C. Maxwell, R.C. Aitken, et al. · 146
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing
2002 · P. Nigh, W. Needham, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 141
Convolutional compaction of test responses
2004 · J. Rajski, J. Tyszer, et al. · 139
Works count: 1,950
Citation count: 22,090
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