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Keyword

fault simulation

Description: A computational technique in digital circuit testing that models the effects of faults to evaluate test patterns and circuit behavior.
OpenAlex ID: keywords/fault-simulation
Digital Systems Testing and Testable Design
1994 · Miron Abramovici, Melvin A. Breuer, et al. · Institute of Electrical and Electronics Engineers eBooks · 2,394
Model for Delay Faults Based Upon Paths
1985 · Gordon L. Smith · 718
HITEC: a test generation package for sequential circuits
2002 · T. Niermann, J.H. Patel · 522
VLSI Test Principles and Architectures: Design for Testability
2006 · Laung‐Terng Wang, Cheng‐Wen Wu, et al. · 445
Fault diagnosis of analog circuits
1985 · J.W. Bandler, A.E. Salama · Proceedings of the IEEE · 444
Logic Testing and Design for Testability
1985 · Hideo Fujiwara · The MIT Press eBooks · 358
Combinational test generation using satisfiability
1996 · P. Stephan, R.K. Brayton, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 326
Delay Fault Testing for VLSI Circuits
1998 · Angela Krstić, Kwang-Ting Cheng · Frontiers in electronic testing · 306
A Deductive Method for Simulating Faults in Logic Circuits
1972 · D.B. Armstrong · IEEE Transactions on Computers · 303
Failure diagnosis of structured VLSI
1989 · J.A. Waicukauski, E. Lindbloom · IEEE Design & Test of Computers · 283
Extraction and simulation of realistic CMOS faults using inductive fault analysis
2003 · F.J. Ferguson, J.P. Shen · 254
Concurrent simulation of nearly identical digital networks
1974 · E. G. Ulrich, T. Baker · Computer · 252
PROOFS: a fast, memory-efficient sequential circuit fault simulator
1992 · T.M. Niermann, Wu-Tung Cheng, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 235
A transformer model for winding fault studies
1994 · P. Bastard, P. Bertrand, et al. · IEEE Transactions on Power Delivery · 222
Critical Path Tracing: An Alternative to Fault Simulation
1984 · Miron Abramovici, P. R. Menon, et al. · IEEE Design & Test of Computers · 217
Boolean Analysis of MOS Circuits
1987 · R.E. Bryant · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 209
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Common Faults and Their Impacts for Rooftop Air Conditioners
1998 · Mark S. Breuker, James E. Braun · Science and Technology for the Built Environment · 195
Digital logic testing and simulation
1986 · Miczo, Alexander. · Microprocessors and Microsystems · 193
A Nine-Valued Circuit Model for Test Generation
1976 · Muth · IEEE Transactions on Computers · 172
Fault modeling and simulation for crosstalk in system-on-chip interconnects
2003 · M. Cuviello, S. Dey, et al. · International Conference on Computer Aided Design · 164
A critical review of fault modeling of HVAC systems in buildings
2018 · Yanfei Li, Zheng O’Neill · Building Simulation · 161
A soft error rate analysis (SERA) methodology
2005 · Ming Zhang, N.R. Shanbhag · 160
Statistical Fault Analysis
1985 · Sunil Jain, Vishwani Agrawal · IEEE Design & Test of Computers · 153
Soft-Error-Rate-Analysis (SERA) Methodology
2006 · M. Zhang, N.R. Shanbhag · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 150
Simulating gear and bearing interactions in the presence of faults
2007 · N. Sawalhi, R.B. Randall · Mechanical Systems and Signal Processing · 149
Works count: 5,623
Citation count: 40,830
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