Keyword

test time reduction

Description: The process of shortening the time required to perform manufacturing or electronic testing while maintaining useful test coverage.

Primary topic: VLSI and Analog Circuit Testing (42%)

OpenAlex ID: keywords/test-time-reduction

Validity and sensitivity of a brief psychomotor vigilance test (PVT-B) to total and partial sleep deprivation

2011 · Mathias Basner, Daniel Mollicone, et al. · Acta Astronautica · 462

A new generation of algorithms for computerized threshold perimetry, SITA

1997 · Boel Bengtsson, Jonny Olsson, et al. · Acta Ophthalmologica Scandinavica · 431

PDF

Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip

2002 · Vikram Iyengar, Krishnendu Chakrabarty, et al. · Journal of Electronic Testing · 403

Test Time in Low-Pressure Shock Tubes

1963 · Harold Mirels · The Physics of Fluids · 346

Test vector decompression via cyclical scan chains and its application to testing core-based designs

2002 · A. Jas, N.A. Touba · Proceedings/Proceedings - International Test Conference · 275

A 4, 2, and 1 stepping algorithm for quick and accurate estimation of cutaneous sensation threshold

1993 · P. J. Dyck, P. C. O'Brien, et al. · Neurology · 275

Adapting scan architectures for low power operation

2002 · L. Whetsel · Proceedings/Proceedings - International Test Conference · 266

Scan vector compression/decompression using statistical coding

2003 · A. Jas, J. Ghosh-Dastidar, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 264

Wrapper design for embedded core test

2002 · E.J. Marinissen, S.K. Goel, et al. · Proceedings/Proceedings - International Test Conference · 224

X-Compact: An Efficient Response Compaction Technique

2004 · S. Mitra, K.S. Kim · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 219

X-compact: an efficient response compaction technique for test cost reduction

2003 · S. Mitra, Kee Sup Kim · Proceedings/Proceedings - International Test Conference · 217

Comprehensive Model for Humidity Testing Correlation

1986 · D. Stewart Peck · IEEE International Reliability Physics Symposium proceedings · 213

Scan chain design for test time reduction in core-based ICs

2002 · J. Aerts, E.J. Marinissen · Proceedings/Proceedings - International Test Conference · 202

The development of a short domain-general measure of working memory capacity

2014 · Frederick L. Oswald, Samuel T. McAbee, et al. · Behavior Research Methods · 193

PDF

Evaluation of a new perimetric threshold strategy, SITA, in patients with manifest and suspect glaucoma

1998 · Boel Bengtsson, Anders Heijl · Acta Ophthalmologica Scandinavica · 192

PDF

Evaluation of a new threshold visual field strategy, SITA, in normal subjects

1998 · Boel Bengtsson, Anders Heijl, et al. · Acta Ophthalmologica Scandinavica · 188

Adrenal masses: evaluation with fast gradient-echo MR imaging and Gd-DTPA-enhanced dynamic studies.

1989 · G P Krestin, W Steinbrich, et al. · Radiology · 183

Minimizing production test time to detect faults in analog circuits

1994 · L. Milor, A.L. Sangiovanni-Vincentelli · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 179

A new procedure for weighted random built-in self-test

2002 · F. Muradali, V.K. Agarwal, et al. · Proceedings/Proceedings - International Test Conference · 161

PDF

SITA Fast, a new rapid perimetric threshold test. Description of methods and evaluation in patients with manifest and suspect glaucoma

1998 · Boel Bengtsson, Anders Heijl · Acta Ophthalmologica Scandinavica · 160

Diagnosis of carotid artery disease: preliminary experience with maximum-intensity-projection spiral CT angiography.

1993 · M P Marks, S Napel, et al. · American Journal of Roentgenology · 157

A decision based one-against-one method for multi-class support vector machine

2004 · R. Debnath, N. Takahide, et al. · Pattern Analysis and Applications · 156

A New SITA Perimetric Threshold Testing Algorithm: Construction and a Multicenter Clinical Study

2018 · Anders Heijl, Vincent Michael Patella, et al. · American Journal of Ophthalmology · 138

PDF

QUIETEST: a quiescent current testing methodology for detecting leakage faults

2002 · W. Mao, R.K. Gulati, et al. · International Conference on Computer Aided Design · 131

A jitter characterization system using a component-invariant Vernier delay line

2004 · A.H. Chan, G.W. Roberts · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 130

Works count: 4,634

Citation count: 31,240