Keyword

testability

Description: The degree to which a claim, system, or component can be evaluated through testing, given available evidence, procedures, and access.

Primary topic: VLSI and Analog Circuit Testing (37%)

Wikidata ID: wiki/Q2149495

OpenAlex ID: keywords/testability

Testability and Meaning

1936 · Rudolf Carnap · Philosophy of Science · 1,341

The Test Access Port and Boundary-Scan Architecture

1990 · C. Maunder, R. Tulloss · 801

The missing link between the theory and empirics of path dependence: Conceptual clarification, testability issue and methodological implications

2010 · Durand, Rodolphe, Vergne, Jean-Philippe · INRIA a CCSD electronic archive server · 505

Evolutionary psychology: Controversies, questions, prospects, and limitations.

2010 · Jaime C. Confer, Judith A. Easton, et al. · American Psychologist · 482

Controllability/observability analysis of digital circuits

1979 · L. Goldstein · IEEE Transactions on Circuits and Systems · 422

xUnit Test Patterns: Refactoring Test Code

2007 · Gerard Meszaros · 393

Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

1980 · Galiay, Crouzet, et al. · IEEE Transactions on Computers · 361

A family of VLSI designs for the motion compensation block-matching algorithm

1989 · K.-M. Yang, M.-T. Sun, et al. · IEEE Transactions on Circuits and Systems · 330

The Philosophy of Economics: An Anthology

1984 · Daniel M. Hausman · 330

Logic Testing and Design for testability

1986 · Fujiwara, Hideo · Computer-Aided Design · 323

Fault tolerant and fault testable hardware design

1985 · P.K. Lala · CERN Document Server (European Organization for Nuclear Research) · 323

Logic Design Principles: With Emphasis on Testable Semicustom Circuits

1986 · E.J. McCluskey · Medical Entomology and Zoology · 308

A UML-Based Approach to System Testing

2002 · Lionel Briand, Yvan Labiche · Software & Systems Modeling · 304

Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic

1973 · M.J.Y. Williams, J.B. Angell · IEEE Transactions on Computers · 300

"Community Structure, Population Control, and Competition"-A Critique

1966 · William W. Murdoch · The American Naturalist · 285

The Arbitrage Pricing Theory: Is it Testable?

1982 · JAY SHANKEN · The Journal of Finance · 268

The Diogenes Approach to Testable Fault-Tolerant Arrays of Processors

1983 · Rosenberg · IEEE Transactions on Computers · 264

A VLSI fuzzy logic controller with reconfigurable, cascadable architecture

1990 · H. Watanabe, W.D. Dettloff, et al. · IEEE Journal of Solid-State Circuits · 262

Multi-level logic minimization using implicit don't cares

1988 · K.A. Bartlett, R.K. Brayton, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 261

HBM (High Bandwidth Memory) DRAM Technology and Architecture

2017 · Hongshin Jun, Jinhee Cho, et al. · IEEE International Memory Workshop (IMW) · 260

Linking propositions

1984 · Davida Y. Teller · Vision Research · 257

Easily Testable Iterative Systems

1973 · A.D. Friedman · IEEE Transactions on Computers · 252

The acceptance and diffusion of the innovative smart phone use: A case study of a delivery service company in logistics

2009 · Jengchung V. Chen, David C. Yen, et al. · Information & Management · 249

On determining scan flip-flops in partial-scan designs

2002 · D.H. Lee, S.M. Reddy · International Conference on Computer Aided Design · 247

Testability and the Refutation and Corroboration of Cladistic Hypotheses

1997 · A Kluge · Cladistics · 245

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Works count: 6,532

Citation count: 51,350