Keyword

automatic test pattern generation

Description: Automatic test pattern generation is an electronic design automation method for producing input patterns that detect faults in digital circuits.

Primary topic: VLSI and Analog Circuit Testing (83%)

Wikidata ID: wiki/Q837455

OpenAlex ID: keywords/automatic-test-pattern-generation

Principles of CMOS VLSI Design: A Systems Perspective

1985 · Neil Weste, Kamran Eshraghian · CERN Document Server (European Organization for Nuclear Research) · 1,566

SOCRATES: a highly efficient automatic test pattern generation system

1988 · M.H. Schulz, E. Trischler, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 573

Test set compaction algorithms for combinational circuits

1998 · Ilker Hamzaoglu, Janak H. Patel · 432

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Testing of Digital Systems

2003 · N. K. Jha, S. Gupta · Cambridge University Press eBooks · 350

OPMISR: the foundation for compressed ATPG vectors

2002 · C. Barnhart, V. Brunkhorst, et al. · Proceedings/Proceedings - International Test Conference · 343

Automatic functional test generation using the extended finite state machine model

1993 · Kwang Ting Cheng, A. S. Krishnakumar · 290

Logic BIST for large industrial designs: real issues and case studies

2003 · G. Hetherington, T. Fryars, et al. · Proceedings/Proceedings - International Test Conference · 281

Minimizing power consumption in scan testing: pattern generation and DFT techniques

2005 · K.M. Butler, J. Saxena, et al. · 274

A topological search algorithm for ATPG

1987 · T. Kirkland, M. R. Mercer · Proceedings - ACM IEEE Design Automation Conference · 270

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A SmartBIST variant with guaranteed encoding

2002 · B. Koenemann, C. Barnhart, et al. · Proceedings - Asian Test Symposium/Proceedings · 269

Case study: Detecting hardware Trojans in third-party digital IP cores

2011 · Xuehui Zhang, Mohammad Tehranipoor · IEEE International Symposium on Hardware Oriented Security and Trust (HOST) · 225

Verification Testing—A Pseudoexhaustive Test Technique

1984 · McCluskey · IEEE Transactions on Computers · 224

Software-Based Self-Testing of Embedded Processors

2005 · N. Kranitis, A. Paschalis, et al. · IEEE Transactions on Computers · 193

ATPG for heat dissipation minimization during test application

1998 · Seongmoon Wang, S.K. Gupta · IEEE Transactions on Computers · 182

Advanced automatic test pattern generation and redundancy identification techniques

2003 · M.H. Schulz, E. Auth · 176

DYNAMITE: an efficient automatic test pattern generation system for path delay faults

1991 · K. Fuchs, F. Fink, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 169

Linear circuit fault diagnosis using neuromorphic analyzers

1997 · R. Spina, S. Upadhyaya · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 168

On low-capture-power test generation for scan testing

2005 · Xiaoqing Wen, Y. Yamashita, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 164

Impact of multiple-detect test patterns on product quality

2004 · B. Benware, C. Schuermyer, et al. · 159

High-frequency, at-speed scan testing

2003 · Xijiiang Lin, R. Press, et al. · IEEE Design & Test of Computers · 158

POIROT: a logic fault diagnosis tool and its applications

2002 · S. Venkataraman, S.B. Drummonds · Proceedings/Proceedings - International Test Conference · 154

Fault Testing for Reversible Circuits

2004 · K.N. Patel, J.P. Hayes, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 149

Combinational and sequential logic optimization by redundancy addition and removal

1995 · L.A. Entrena, Kwang-Ting Cheng · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 141

Improved Test Pattern Generation for Hardware Trojan Detection Using Genetic Algorithm and Boolean Satisfiability

2015 · Sayandeep Saha, Rajat Subhra Chakraborty, et al. · Lecture notes in computer science · 131

Low-capture-power test generation for scan-based at-speed testing

2006 · Xiaoqing Wen, Y. Yamashita, et al. · 126

Works count: 2,906

Citation count: 31,770