Keyword

test data compression

Description: A digital testing technique that reduces the volume of test patterns and data required to verify integrated circuits and electronic systems.

Primary topic: VLSI and Analog Circuit Testing (89%)

OpenAlex ID: keywords/test-data-compression

Embedded Deterministic Test

2004 · J. Rajski, J. Tyszer, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 527

VLSI Test Principles and Architectures: Design for Testability

2006 · Laung‐Terng Wang, Cheng‐Wen Wu, et al. · 445

Survey of Test Vector Compression Techniques

2006 · N.A. Touba · IEEE Design & Test of Computers · 439

Embedded deterministic test for low cost manufacturing test

2003 · J. Rajski, J. Tyszer, et al. · Proceedings/Proceedings - International Test Conference · 402

System-on-a-chip test-data compression and decompression architectures based on Golomb codes

2001 · A. Chandra, K. Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 370

An efficient test vector compression scheme using selective huffman coding

2003 · A. Jas, J. Ghosh-Dastidar, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 277

Test vector decompression via cyclical scan chains and its application to testing core-based designs

2002 · A. Jas, N.A. Touba · Proceedings/Proceedings - International Test Conference · 275

Scan vector compression/decompression using statistical coding

2003 · A. Jas, J. Ghosh-Dastidar, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 264

Frequency-directed run-length (FDR) codes with application to system-on-a-chip test data compression

2002 · A. Chandra, K. Chakrabarty · 236

Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes

2003 · A. Chandra, K. Chakrabarty · IEEE Transactions on Computers · 230

Electronic Design Automation: Synthesis, Verification, and Test

2009 · Laung‐Terng Wang, Charles H.‐P. Wen, et al. · Rare & Special e-Zone (The Hong Kong University of Science and Technology) · 181

Measures of the Effectiveness of Fault Signature Analysis

1980 · Smith · IEEE Transactions on Computers · 178

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Variable-length input huffman coding for system-on-a-chip test

2003 · P.T. Gonciari, B.M. Al-Hashimi, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 169

Reducing test data volume using LFSR reseeding with seed compression

2003 · C.V. Krishna, N.A. Touba · Proceedings/Proceedings - International Test Conference · 167

A unified approach to reduce soc test data volume, scan power and testing time

2003 · A. Chandra, K. Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 162

Nine-coded compression technique for testing embedded cores in SoCs

2005 · M. Tehranipoor, M. Nourani, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 136

Test data compression for system-on-a-chip using Golomb codes

2002 · A. Chandra, K. Chakrabarty · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 133

RL-huffman encoding for test compression and power reduction in scan applications

2005 · Mehrdad Nourani, Mohammad H. Tehranipour · ACM Transactions on Design Automation of Electronic Systems · 131

Optimal Selective Huffman Coding for Test-Data Compression

2007 · Xrysovalantis Kavousianos, Emmanouil Kalligeros, et al. · IEEE Transactions on Computers · 126

Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression

2002 · P.T. Gonciari, Bashir M. Al‐Hashimi, et al. · ePrints Soton (University of Southampton) · 125

Channel masking synthesis for efficient on-chip test compression

2005 · V. Chickermane, B. Foutz, et al. · 120

Extending OPMISR beyond 10× scan test efficiency

2002 · C. Barnhart, V. Brunkhorst, et al. · IEEE Design & Test of Computers · 119

Two-dimensional test data compression for scan-based deterministic BIST

2002 · Hua-Guo Liang, S. Hellebrand, et al. · Proceedings/Proceedings - International Test Conference · 106

Test data compression using dictionaries with selective entries and fixed-length indices

2003 · Lei Li, Krishnendu Chakrabarty, et al. · ACM Transactions on Design Automation of Electronic Systems · 103

Reduction of SOC test data volume, scan power and testing time using alternating run-length codes

2002 · Anshuman Chandra, Krishnendu Chakrabarty · Proceedings - ACM IEEE Design Automation Conference · 103

Works count: 1,462

Citation count: 14,650