Keyword

IDDQ testing

Description: A digital integrated-circuit testing method that detects faults by measuring quiescent power-supply current, particularly in CMOS devices.

Primary topic: VLSI and Analog Circuit Testing (92%)

Wikidata ID: wiki/Q5987815

OpenAlex ID: keywords/iddq-testing

Testing of Digital Systems

2003 · N. K. Jha, S. Gupta · Cambridge University Press eBooks · 350

An experimental chip to evaluate test techniques experiment results

2002 · S.C. Ma, P. Franco, et al. · Proceedings/Proceedings - International Test Conference · 274

Intrinsic leakage in low power deep submicron CMOS ICs

2002 · A. Keshavarzi, K. Roy, et al. · Proceedings/Proceedings - International Test Conference · 203

Iddq testing for CMOS VLSI

2000 · R. Rajsuman · Proceedings of the IEEE · 200

Stuck-fault tests vs. actual defects

2002 · E.J. McCluskey, Chao-Wen Tseng · Proceedings/Proceedings - International Test Conference · 179

System-On-A-Chip: Design and Test

2000 · R. Rajsuman · 173

Current ratios: a self-scaling technique for production I/sub DDQ/ testing

2003 · P. Maxwell, P. O'Neill, et al. · Proceedings/Proceedings - International Test Conference · 159

Iddq test: sensitivity analysis of scaling

2002 · T.W. Williams, R.H. Dennard, et al. · 151

Quiescent power supply current measurement for CMOS IC defect detection

1989 · C.F. Hawkins, J.M. Soden, et al. · IEEE Transactions on Industrial Electronics · 147

IDDQ and AC scan: the war against unmodelled defects

2002 · P.C. Maxwell, R.C. Aitken, et al. · 146

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

2002 · P. Nigh, W. Needham, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 141

Electrical properties and detection methods for CMOS IC defects

2003 · J.M. Soden, C.F. Hawkins · 140

QUIETEST: a quiescent current testing methodology for detecting leakage faults

2002 · W. Mao, R.K. Gulati, et al. · International Conference on Computer Aided Design · 131

Current signatures [VLSI circuit testing]

2002 · A.E. Gattiker, W. Maly · 121

I DDQ Testing: A Review

1992 · Jerry M. Soden, Charles F. Hawkins, et al. · Springer eBooks · 121

Current signatures: application

2002 · A.E. Gattiker, W. Maly · Proceedings/Proceedings - International Test Conference · 116

The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need?

1992 · P.C. Maxwell, Robert Aitken, et al. · 116

Neighbor selection for variance reduction in I/sub DDQ/ and other parametric data

2002 · W.R. Daasch, K. Cota, et al. · Proceedings/Proceedings - International Test Conference · 109

CMOS IC stuck-open-fault electrical effects and design considerations

2003 · J.M. Soden, R.K. Treece, et al. · 108

Testing for parametric faults in static CMOS circuits

2002 · F.J. Ferguson, M. Taylor, et al. · Proceedings/Proceedings - International Test Conference · 98

Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/ testing

1994 · V.H. Champac, A. Rubio, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 93

Statistical post-processing at wafersort-an alternative to burn-in and a manufacturable solution to test limit setting for sub-micron technologies

2003 · R. Madge, M. Rehani, et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 91

Current ratios: a self-scaling technique for production IDDQ testing

2002 · P. Maxwell, P. O'Neill, et al. · Proceedings/Proceedings - International Test Conference · 91

Differential Power Analysis

2011 · SpringerReference · 86

An histogram based procedure for current testing of active defects

2003 · C. Thibeault · Proceedings/Proceedings - International Test Conference · 83

Works count: 1,197

Citation count: 12,190