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An experimental chip to evaluate test techniques experiment results

Year: 2002

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/test.1995.529895

Authors: S.C. Ma, P. Franco, E.J. McCluskey

Institutions: Advanced Micro Devices (United States), Synopsys (United States), Stanford University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2171908682

FWCI: 20.11

Cites: 8

Cited by: 274

Related to: 10