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Keyword

fault coverage

Description: A measure of the proportion of modeled faults in an electronic system that a test process can detect.
Wikidata ID: wiki/Q5438152
OpenAlex ID: keywords/fault-coverage
Error detection by duplicated instructions in super-scalar processors
2002 · N. Oh, P.P. Shirvani, et al. · IEEE Transactions on Reliability · 584
Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
1995 · S. Hellebrand, J. Rajski, et al. · IEEE Transactions on Computers · 408
Formal methods for protocol testing: a detailed study
1989 · D.P. Sidhu, T.-K. Leung · IEEE Transactions on Software Engineering · 389
Test Generation for Microprocessors
1980 · Thatte, Abraham · IEEE Transactions on Computers · 387
A partial scan method for sequential circuits with feedback
1990 · K.-T. Cheng, V.D. Agrawal · IEEE Transactions on Computers · 355
Defect Level as a Function of Fault Coverage
1981 · T.W. Williams, N.C. Brown · IEEE Transactions on Computers · 349
Minimized power consumption for scan-based BIST
2003 · S. Gerstendorfer, H.-J. Wunderlich · Proceedings/Proceedings - International Test Conference · 302
Logic BIST for large industrial designs: real issues and case studies
2003 · G. Hetherington, T. Fryars, et al. · Proceedings/Proceedings - International Test Conference · 281
Random Pattern Testability
1984 · Jacob Savir, Gary S. Ditlow, et al. · IEEE Transactions on Computers · 277
Using march tests to test SRAMs
1993 · A.J. Van De Goor · IEEE Design & Test of Computers · 275
Test selection based on communicating nondeterministic finite-state machines using a generalized Wp-method
1994 · Gang Luo, G. von Bochmann, et al. · IEEE Transactions on Software Engineering · 265
Compactest: a Method to Generate Compact Test Sets for Combinational Circuits
2005 · I. Pomeranz, L.N. Reddy, et al. · Proceedings/Proceedings - International Test Conference · 261
Broad-side delay test
1994 · J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 256
Design and evaluation of system-level checks for on-line control flow error detection
1999 · Z. Alkhalifa, V.S.S. Nair, et al. · IEEE Transactions on Parallel and Distributed Systems · 242
Software-based self-testing methodology for processor cores
2001 · Li Chen, S. Dey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 234
Verification Testing—A Pseudoexhaustive Test Technique
1984 · McCluskey · IEEE Transactions on Computers · 224
Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits
1995 · S. Kajihara, I. Pomeranz, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 222
COMPACTEST: a method to generate compact test sets for combinational circuits
1993 · I. Pomeranz, L.N. Reddy, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 213
Bit-flipping BIST
1996 · Hans-Joachim Wunderlich, Gundolf Kiefer · International Conference on Computer Aided Design · 208
A CMOS fault extractor for inductive fault analysis
1988 · F.J. Ferguson, J.P. Shen · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 205
Test generation for sequential circuits
1988 · H.-K.T. Ma, S. Devadas, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 202
Altering a pseudo-random bit sequence for scan-based BIST
2002 · N.A. Touba, E.J. McCluskey · 191
Fault modeling and test algorithm development for static random access memories
2003 · R. Dekker, F. Beenker, et al. · 182
Testing of Quantum Cellular Automata
2004 · M.B. Tahoori, J. Huang, et al. · IEEE Transactions on Nanotechnology · 179
Minimizing production test time to detect faults in analog circuits
1994 · L. Milor, A.L. Sangiovanni-Vincentelli · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 179
Works count: 6,172
Citation count: 64,380
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