Work

Built-in test for VLSI — pseudorandom techniques

Year: 1989

Type: article

Source: Microprocessors and Microsystems

DOI: 10.1016/0141-9331(89)90036-7

Author: Colin Maunder

Institution: BT Research

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W260727648

FWCI: 16.16

Cites:

Cited by: 638

Related to: 10