Keyword

fault models

Description: Representations of possible defects or malfunction behaviors used to design and evaluate engineering systems and software tests.

Primary topic: VLSI and Analog Circuit Testing (28%)

Wikidata ID: wiki/Q1401211

OpenAlex ID: keywords/fault-models

Consensus in the presence of partial synchrony

1988 · Cynthia Dwork, Nancy Lynch, et al. · Journal of the ACM · 1,908

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Towards robust distributed systems (abstract)

2000 · Eric A. Brewer · 810

Readings in Model-Based Diagnosis

1992 · Walter Hamscher, Luca Console, et al. · Institutional Research Information System University of Turin (University of Turin) · 526

Inductive Fault Analysis of MOS Integrated Circuits

1985 · John Shen, W. Maly, et al. · IEEE Design & Test of Computers · 506

Test Generation for Microprocessors

1980 · Thatte, Abraham · IEEE Transactions on Computers · 387

Diagnosis of Bearing Faults in Induction Machines by Vibration or Current Signals: A Critical Comparison

2010 · Fabio Immovilli, Alberto Bellini, et al. · IEEE Transactions on Industry Applications · 382

Fault Based Cryptanalysis of the Advanced Encryption Standard (AES)

2003 · Johannes Blömer, Jean-Pierre Seifert · Lecture notes in computer science · 355

Testing of Digital Systems

2003 · N. K. Jha, S. Gupta · Cambridge University Press eBooks · 350

Surface deformation associated with dip-slip faulting

1966 · J. C. Savage, L. M. Hastie · Journal of Geophysical Research Atmospheres · 309

Delay Fault Testing for VLSI Circuits

1998 · Angela Krstić, Kwang-Ting Cheng · Frontiers in electronic testing · 306

Using march tests to test SRAMs

1993 · A.J. Van De Goor · IEEE Design & Test of Computers · 275

Verdi: a framework for implementing and formally verifying distributed systems

2015 · James R. Wilcox, Doug Woos, et al. · Proceedings of the ACM SIGPLAN Conference on Programming Language Design and Implementation · 270

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Blockchain Consensus Protocols in the Wild

2017 · Cachin, Christian, Vukolić, Marko · arXiv (Cornell University) · 252

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A realistic fault model and test algorithms for static random access memories

1990 · R. Dekker, F. Beenker, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 236

“Physical Negation”—integrating fault models into the General Diagnostic Engine

1989 · Peter Struß, Oskar Dressier · International Joint Conference on Artificial Intelligence · 235

Fault and Error Tolerance in Neural Networks: A Review

2017 · Cesar Torres-Huitzil, Bernard Girau · IEEE Access · 228

Functional memory faults: a formal notation and a taxonomy

2002 · Ad.J. van de Goor, Z. Al-Ars · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 206

Standard Analysis for Transfer Delay in CTCS‐3

2017 · Yuan Cao, Lianchuan Ma, et al. · Chinese Journal of Electronics · 205

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Specification of a Soon-to-Occur Seismic Faulting in the Tokai District, Central Japan, Based Upon Seismotectonics

2011 · Katsuhiko Ishibashi · Maurice Ewing series · 205

A CMOS fault extractor for inductive fault analysis

1988 · F.J. Ferguson, J.P. Shen · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 205

Defect classes-an overdue paradigm for CMOS IC testing

2002 · C.F. Hawkins, J.M. Soden, et al. · Proceedings/Proceedings - International Test Conference · 201

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Efficient Algorithms for Testing Semiconductor Random-Access Memories

1978 · Nair, Thatte, et al. · IEEE Transactions on Computers · 201

Statistical physics approach to earthquake occurrence and forecasting

2016 · Lucilla de Arcangelis, Cataldo Godano, et al. · Physics Reports · 197

Methods for fault tolerance in networks-on-chip

2013 · Martin Radetzki, Chaochao Feng, et al. · ACM Computing Surveys · 195

Ursa minor: versatile cluster-based storage

2005 · Michael Abd-El-Malek, William V. Courtright, et al. · 185

Works count: 3,141

Citation count: 36,480