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C. Hora

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs
2009 · F. Hapke, R. Krenz-Baath, et al. · IEEE International Test Conference (ITC) · 95
Systematic defects in deep sub-micron technologies
2005 · B. Kruseman, A. Majhi, et al. · IEEE International Test Conference (ITC) · 69
An effective diagnosis method to support yield improvement
2003 · C. Hora, R. Segers, et al. · IEEE International Test Conference (ITC) · 65
Diagnosis of Local Spot Defects in Analog Circuits
2012 · Ke Huang, H. G. Stratigopoulos, et al. · IEEE Transactions on Instrumentation and Measurement · 58
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality
2008 · S. Eichenberger, J. Geuzebroek, et al. · IEEE International Test Conference (ITC) · 43
A novel stuck-at based method for transistor stuck-open fault diagnosis
2006 · Xinyue Fan, W. Moore, et al. · IEEE International Test Conference (ITC) · 38
Trends in testing integrated circuits
2005 · B. Vermeulen, C. Hora, et al. · IEEE International Test Conference (ITC) · 34
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis
2006 · Xinyue Fan, W. Moore, et al. · IEEE VLSI Test Symposium (VTS) · 32
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example
2011 · H Hashempour, J Dohmen, et al. · Design, Automation, and Test in Europe · 27
Diagnosis of Full Open Defects in Interconnecting Lines
2007 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE VLSI Test Symposium (VTS) · 26
Medical data mining with extended WEKA
2012 · R. Robu, C. Hora · IEEE International Conference on Intelligent Engineering Systems (INES) · 17
Extending gate-level diagnosis tools to CMOS intra-gate faults
2007 · X. Fan, W.R. Moore, et al. · IET Computers & Digital Techniques · 17
Stuck-Open Fault Diagnosis with Stuck-At Model
2005 · Xinyue Fan, W. Moore, et al. · IEEE European Test Symposium (ETS) · 17
Impact of gate tunnelling leakage on CMOS circuits with full open defects
2007 · R. Rodríguez-Montañés, D. Arumí, et al. · Electronics Letters · 12
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages
2007 · D. Arumi, R. Rodriguez-Montanes, et al. · IEEE VLSI Test Symposium (VTS) · 9
I DDQ -based diagnosis at very low voltage (VLV) for bridging defects
2007 · D. Arumi, R. Rodríguez-Montañés, et al. · Electronics Letters · 9
Diagnosis of full open defects in interconnect lines with fan-out
2010 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE European Test Symposium (ETS) · 8
Time-dependent Behaviour of Full Open Defects in Interconnect Lines
2008 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE International Test Conference (ITC) · 6
Improving diagnostic resolution of delay faults using path delay fault model
2003 · A.K. Majhi, G. Gronthoud, et al. · IEEE VLSI Test Symposium (VTS) · 6
VTS 2007 Best Paper Award
2007 · Adit D. Singh, Magdy S. Abadir, et al.
Works count: 20
Citation count: 588
H-index: 13
I10-index: 14
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