Work

A novel stuck-at based method for transistor stuck-open fault diagnosis

Year: 2006

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2005.1583996

Authors: Xinyue Fan, W. Moore, C. Hora, G. Gronthoud

Institutions: University of Oxford, Philips (Netherlands)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139164696

FWCI: 4.666

Cites: 11

Cited by: 38

Related to: 10