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Xinyue Fan
Observed name:
Fan, Xinyue
Institution:
University of Oxford
Observed institution:
University of Oxford
OpenAlex ID:
A5025902249
A novel stuck-at based method for transistor stuck-open fault diagnosis
2006
·
Xinyue Fan
, W. Moore
, et al.
·
IEEE International Test Conference (ITC)
·
38
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis
2006
·
Xinyue Fan
, W. Moore
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
32
Stuck-Open Fault Diagnosis with Stuck-At Model
2005
·
Xinyue Fan
, W. Moore
, et al.
·
IEEE European Test Symposium (ETS)
·
17
Intra-gate fault diagnosis of CMOS integrated circuits
2006
·
Fan, Xinyue
, Fan, Xinyue.
·
OpenGrey (Institut de l'Information Scientifique et Technique)
·
1
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Works count:
4
Citation count:
88
H-index:
3
I10-index:
3
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