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Nagesh Tamarapalli

Observed names: N. Tamarapalli, Tamarapalli, Nagesh V.
OpenAlex ID: A5055375120
Embedded deterministic test for low cost manufacturing test
2003 · J. Rajski, J. Tyszer, et al. · IEEE International Test Conference (ITC) · 395
Logic BIST for large industrial designs: real issues and case studies
2003 · G. Hetherington, T. Fryars, et al. · IEEE International Test Conference (ITC) · 277
High-frequency, at-speed scan testing
2003 · Xijiiang Lin, R. Press, et al. · IEEE Design & Test of Computers · 158
Impact of multiple-detect test patterns on product quality
2004 · B. Benware, C. Schuermyer, et al. · IEEE International Test Conference (ITC) · 155
Constructive multi-phase test point insertion for scan-based BIST
2002 · N. Tamarapalli, J. Rajski · IEEE International Test Conference (ITC) · 135
Automated synthesis of phase shifters for built-in self-test applications
2000 · J. Rajski, N. Tamarapalli, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 83
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis
2006 · Martin Keim, Nagesh Tamarapalli, et al. · IEEE International Test Conference (ITC) · 72
Embedded deterministic test for low-cost manufacturing
2003 · J. Rajski, M. Kassab, et al. · IEEE Design & Test of Computers · 64
Compactor independent direct diagnosis
2005 · Wu-Tung Cheng, Kun-Han Tsai, et al. · Proceedings - Asian Test Symposium/Proceedings · 63
Automated synthesis of large phase shifters for built-in self-test
2002 · J. Rajski, N. Tamarapalli, et al. · IEEE International Test Conference (ITC) · 61
Compression mode diagnosis enables high volume monitoring diagnosis flow
2006 · A. Leininger, P. Muhmenthaler, et al. · IEEE International Test Conference (ITC) · 50
Diagnosis with Limited Failure Information
2006 · Yu Huang, Wu-tung Cheng, et al. · IEEE International Test Conference (ITC) · 38
Yield Learning with Layout-aware Advanced Scan Diagnosis
2006 · Jayanth Mekkoth, Murali Krishna, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 29
Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis
2006 · Nandu Tendolkar, Dawit Belete, et al. · IEEE International Test Conference (ITC) · 18
Industrial experience with adoption of edt for low-cost test without concessions
2004 · F. Poehl, M. Beek, et al. · IEEE International Test Conference (ITC) · 17
Advanced Scan Diagnosis Based Fault Isolation and Defect Identification for Yield Learning
2005 · Chris Eddleman, Nagesh Tamarapalli, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 12
The Next Step in Volume Scan Diagnosis: Standard Fail Data Format
2006 · Andreas Leininger, Ajay Khoche, et al. · Proceedings - Asian Test Symposium/Proceedings · 5
Tutorial T5: High Performance Low Power Designs - Challenges and Best practices in Design, Verification and Test
2015 · Nagesh Tamarapalli, Prashanth Vallur, et al. · International Conference on VLSI Design
Application of Test-View Modeling to Hierarchical ATPG
2014 · Rahul Shukla, Phong Loi, et al. · International Conference on VLSI Design
Tutorial T10: Post - Silicon Validation, Debug and Diagnosis
2013 · Prabhat Mishra, Masahiro Fujita, et al. · International Conference on VLSI Design
Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis -- The Loop to Ensure Product Yield
2012 · S. Venkataraman, N. Tamarapalli · International Conference on VLSI Design
Debugging an Invisible Flaky Scan Chain Defect
2011 · Rahul Shukla, Richard Billings, et al. · Proceedings - International Symposium for Testing and Failure Analysis
DFM / DFT / SiliconDebug / Diagnosis
2008 · Srikanth Venkataraman, Nagesh Tamarapalli · International Conference on VLSI Design
DFM, DFT, silicon debug and diagnosis -the loop to ensure product yield
2006 · D. Abercrombie, B. Koenemann, et al. · International Conference on VLSI Design
Works count: 27
Citation count: 1,632
H-index: 15
I10-index: 16
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