Work

Embedded deterministic test for low-cost manufacturing

Year: 2003

Type: article

Source: IEEE Design & Test of Computers

DOI: 10.1109/mdt.2003.1232257

Authors: J. Rajski, M. Kassab, N. Mukherjee, N. Tamarapalli, J. Tyszer, Jun Qian

Institutions: Mentor Graphics (United States), Poznań University of Technology, Cisco Systems (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2011363932

FWCI: 7.594

Cites: 13

Cited by: 64

Related to: 10