Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
M. Zadražil
Observed names:
M Zadrazil,
M Zadražil,
M. Zadrazil,
M. ZadraŽil,
Martin Zadrazil,
Martin Zadražil,
Zadražil, Martin
show all 7
Observed institutions:
Tescan (Czechia),
Czech Academy of Sciences,
Czech Academy of Sciences, Institute of Scientific Instruments,
University of York
OpenAlex ID:
A5059156989
The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison
2008
·
C.G.H. Walker
, M.M. El‐Gomati
, et al.
·
Scanning
·
152
Theory Experiment Comparison of the Electron Backscattering Factor from Solids at Low Electron Energy (250–5,000 eV)
2008
·
M. M. EL Gomati
, C. G. H. Walker
, et al.
·
Scanning
·
88
Scanning electron microscopy of nonconductive specimens at critical energies in a cathode lens system
2001
·
Luděk Frank
, Martin Zadražil
, et al.
·
Scanning
·
24
Electron Backscattering from Real and In-Situ Treated Surfaces
2000
·
Luděk Frank
, Richard Steklý
, et al.
·
Microchimica Acta
·
20
Novel Plasma FIB/SEM for High Speed Failure Analysis and Real Time Imaging of Large Volume Removal
2012
·
T. Hrnčíř
, F. Lopour
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
16
Combined plasma FIB-SEM
2012
·
J. Jiruse
, T. Hrncir
, et al.
·
Microscopy and Microanalysis
·
14
A differentially pumped secondary electron detector for low‐vacuum scanning electron microscopy
2003
·
M. Jacka
, M. Zadrazil
, et al.
·
Scanning
·
10
Wide-field SEM of semiconducting minerals
2010
·
James C. Weaver
, William Mershon
, et al.
·
Materials Today
·
5
Low Energy Imaging of Nonconductive Surfaces in SEM
1996
·
Luděk Frank
, Martin Zadražil
, et al.
·
Springer eBooks
·
4
Fast 3D tomography at package level by using Xe plasma focused ion beam
2013
·
T. Hrncir
, L. Hladik
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
·
2
NanoHand: micro/nano system for automatic handling of nano-objects
2007
·
S. Fatikow
, V. Eichhorn
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Computer Controlled Low Energy SEM
2003
·
Filip Mika
, Josef Ryšávka
, et al.
·
Microscopy and Microanalysis
·
2
On the measurement of low energy backscattered and secondary electron coefficients
2022
·
M. M. El Gomati
, A M D Assa’d
, et al.
·
CRC Press eBooks
·
1
The step towards an ultimate multifunctional tool for nanotechnology
2012
·
Martin Zadrazil
, Jaroslav Jiruse
, et al.
·
IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
·
1
Qualitative evaluation of innovation ecosystems: Example Portugal
2026
·
Salavisa, Isabel
, Ribeiro, Bernardete
, et al.
·
Repositório do ISCTE-IUL
PDF
Study of bevelled InP-based heterostructures by low energy SEM and AES
2022
·
R Srnanek
, A Satka
, et al.
·
CRC Press eBooks
An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental Solids
2008
·
CGH Walker
, MM El-Gomati
, et al.
·
Microscopy and Microanalysis
Study of native Pine megagametophyte cells by new low vacuum scanning electron microscope VEGA TS 5136
2003
·
J. Hřib
, Roman Janisch
, et al.
In situ low vacuum scanning electron microscopy of pine megagametophyte cell organelles
2002
·
J. Hřib
, Roman Janisch
, et al.
In situ nízkovakuová rastrovací elektronová mikroskopie suchých semen borovice černé (Pinus nigra Arn.) a borovice lesní (Pinus sylvestris L.)
2002
·
J. Hřib
, Ladislav Ilkovics
, et al.
Show more works
View as search
Works count:
24
Citation count:
341
H-index:
7
I10-index:
7
Year
Topic
Type
