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Byong Kim

Ultra-high density MEMS probe memory device
2009 · John Heck, Donald Adams, et al. · Microelectronic Engineering · 16
High-throughput automatic defect review for 300mm blank wafers with atomic force microscope
2015 · Ardavan Zandiatashbar, Byong Kim, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
On the use of energy minimization for CA based analysis in elasticity
2000 · P. Hajela, Byong Kim · AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference (SDM) · 9
Untitled
1997 · Woo Lee, Byong Kim · Surgical Laparoscopy Endoscopy & Percutaneous Techniques · 9
Fabrication of nanofluidic devices and the study of fluid transport through them
2005 · Haim H. Bau, Shashank Sinha, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
Studying post-etching silicon crystal defects on 300mm wafer by automatic defect review AFM
2016 · Ardavan Zandiatashbar, Patrick A. Taylor, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Contact AFM Nanolithography Based on Anodic Oxidation
2020 · Armando Melgarejo, Ben Schoenek, et al. · Microscopy Today · 3
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Automatic defect review for EUV photomask reticles by atomic force microscope
2015 · Ardavan Zandiatashbar, Byong Kim, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
Surface Potential Imaging of F14H20 Molecules via Sideband Kelvin Probe Force Microscopy
2021 · Armando Melgarejo, Ben Schoenek, et al. · Microscopy Today · 2
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Electrical and Mechanical Characterization of Li Ion Battery Electrode using PinPoint™ SSRM
2020 · John Paul Pineda, Cathy Lee, et al. · Microscopy Today · 2
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Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)
2019 · Gabriela Mendoza, Byong Kim, et al. · Microscopy and Microanalysis · 2
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Automated Non-Destructive Imaging and Characterization of the Graphene/hBN Moiré Pattern with Non-Contact Mode AFM
2015 · Ardavan Zandiatashbar, Byong Kim, et al. · Microscopy Today · 2
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Topography, Phase Imaging, and Mechanical Property Investigation of Polyester Yarn Interaction with Silicone Gel Matrix
2016 · Gerald Pascual, Byong Kim, et al. · Microscopy Today · 1
White Paper: Collagen fibrils imaging in air and in liquid
2016 · Mina Hong, Gerald Pascual, et al. · MRS Bulletin · 1
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Characterizing Scintillation Properties of Cdse/Cdznse Core-Shell Quantum Dot Under Gamma-Ray Irradiation
2024 · Jihwan Boo, Nam Young Kim, et al. · SSRN Electronic Journal
Nanoscale Electrochemistry Study Using SECCM Option of Park Systems
2021 · Jiali Zhang, Byong Kim · ECS Meeting Abstracts
Simultaneous topographical and electrochemical mapping using scanning ion conductance microscopy - scanning electrochemical microscopy (SICM-SECM)
2018 · Wenqing Shi, Gabriela Mendoza, et al. · Nano Research & Applications
Characterization of Multilayered Ceramic Capacitors via Piezoelectric Force Microscopy
2018 · Gerald Pascual, Cathy Lee, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Automated AFM for small-scale and large-scale surface profiling in CMP applications
2018 · Ardavan Zandiatashbar, Byong Kim, et al. · Metrology, Inspection, and Process Control XXXVI
Nanochip: A MEMS-Based Ultra-High Data Density Memory Device
2010 · Nickolai Belov, Donald Adams, et al. · NATO science for peace and security series. B, Physics and biophysics
Observations of Simple and Complex Liquid Transport in Carbon Nanotubes
2005 · Byong Kim, Shashank Sinha, et al. · Bulletin of the American Physical Society
Optical Microscope Study of Liquid Transport in Carbon Nanotubes
2004 · Haim H. Bau, Byong Kim, et al. · APS
Works count: 22
Citation count: 68
H-index: 5
I10-index: 1
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