Author

Juhani Rauhamaa

Observed names: J. Rauhamaa, JUHANI RAUHAMAA

Observed institution: ABB (Finland)

OpenAlex ID: A5060457683

Multiscale Fourier descriptors for defect image retrieval

2005 · Iivari Kunttu, Leena Lepistö, et al. · Pattern Recognition Letters · 69

Multiscale Fourier descriptor for shape classification

2004 · I. Kunttu, L. Lepisto, et al. · International Conference on Image Analysis and Processing · 53

Multiscale Fourier descriptor for shape-based image retrieval

2004 · I. Kunttu, L. Lepisto, et al. · Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition · 50

A Defect Detection Scheme for Web Surface Inspection

2000 · JUKKA IIVARINEN, KATRIINA HEIKKINEN, et al. · International Journal of Pattern Recognition and Artificial Intelligence · 34

Unsupervised segmentation of surface defects

1996 · J. Iivarinen, J. Rauhamaa, et al. · Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition · 32

Image Correlogram in Image Database Indexing and Retrieval

2003 · IIVARI KUNTTU, LEENA LEPISTÖ, et al. · International Workshop on Image Analysis for Multimedia Interactive Services (WIAMIS) · 23

Binary Histogram in Image Classification for Retrieval Purposes

2003 · Iivari Kunttu, Leena Lepistö, et al. · Digital Library (University of West Bohemia) · 15

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Fourier-Based Object Description in Defect Image Retrieval

2006 · Iivari Kunttu, Leena Lepistö, et al. · Machine Vision and Applications · 14

A SOM-based system for web surface inspection

2004 · Jukka Iivarinen, Jussi Pakkanen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9

Surface inspection of web materials using the self-organizing map

1998 · Jukka Iivarinen, Juhani Rauhamaa · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8

Content-Based Retrieval of Surface Defect Images with PicSOM

2004 · Jukka Iivarinen, Rami Rautkorpi, et al. · 7

Directional Filtering for Sequential Image Analysis

2008 · Juho Vihonen, Juha Jylha, et al. · IEEE Signal Processing Letters · 5

Content-based image retrieval in surface inspection

2004 · J. Iivarinen, J. Pakkanen, et al. · International Conference on Control, Automation, Robotics and Vision (ICARCV) · 4

Classification method for defect images based on association and clustering

2003 · Iivari Kunttu, Leena Lepisto, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

Color Fourier Descriptor for Defect Image Retrieval

2005 · Iivari Kunttu, Leena Lepistö, et al. · Lecture notes in computer science · 3

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Binary Co-occurrence Matrix in Image Database Indexing

2003 · Iivari Kunttu, Leena Lepistö, et al. · Lecture notes in computer science · 3

An Adaptive Approach to Segmentation of Surface Defects

1996 · Jukka Iivarinen, Juhani Rauhamaa, et al. · 2

Metadata in Sequential Real-Time 2-D Detection

2007 · Juho Vihonen, Timo Ala-Kleemola, et al. · IEEE Signal Processing Letters · 1

Classification of non-homogenous images using classification probability vector

2005 · L. Lepisto, I. Kunttu, et al. · Proceedings - International Conference on Image Processing · 1

Image retrieval segmentation

2002 · Iivari Kunttu, Leena Lepistö, et al.

Works count: 24

Citation count: 337

H-index: 9

I10-index: 8