Author

Augusli Kifli

Observed names: A. Kifli, AUGUSLI KIFLI, Augusli KiFli
Observed institutions: Faraday Technology (Taiwan), IMEC
OpenAlex ID: A5062790231
2002 · Dirk Lanneer, Johan Praet, et al. · Springer eBooks · 116
1997 · G. Goossens, J. Van Praet, et al. · Proceedings of the IEEE · 66
1995 · Gert Goossens, Dirk Lanneer, et al. · The Journal of VLSI Signal Processing Systems for Signal Image and Video Technology · 22
1995 · Augusli Kifli, Gert Goossens, et al. · 14
2002 · A. Kifli, G. Goossens, et al. · European Design and Test Conference · 11
2010 · Kun-Han Tsai, Yu Huang, et al. · IEEE International Test Conference (ITC) · 9
2008 · Ming-Ting Hsieh, Shun-Yen Lu, et al. · Proceedings - Asian Test Symposium/Proceedings · 3
2009 · Bing-Chuan Bai, Augusli Kifli, et al. · Asia and South Pacific Design Automation Conference (ASP-DAC) · 2
2009 · Augusli Kifli, Y.W. Chen, et al. · Proceedings - Asian Test Symposium/Proceedings · 1
2007 · Augusli Kifli, W.J. Chen, et al. · International Symposium on VLSI Design, Automation and Test · 1
2015 · Augusli Kifli, K C Wu · International Symposium on VLSI Design, Automation and Test
2009 · Bing-Chuan Bai, Chien-Mo Li, et al. · IEEE International Test Conference (ITC)
Works count: 17
Citation count: 249
H-index: 6
I10-index: 5
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