Work

A scalable quantitative measure of IR-drop effects for scan pattern generation

Year: 2010

Type: conference-paper

DOI: 10.1109/iccad.2010.5654130

Authors: M.-F. Wu, Kun-Han Tsai, Wu-Tung Cheng, H.-C. Pan, Jiun-Lang Huang, Augusli Kifli

Institutions: National Taiwan University, Mentor Graphics (United States), Faraday Technology (Taiwan)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4240435252

FWCI: 0.36

Cites: 9

Cited by: 3

Related to: 10