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A. Dehbi

Observed names: Atallah DEHBI, Atallah Dehbi
OpenAlex ID: A5065779558
High temperature reliability testing of aluminum and tantalum electrolytic capacitors
2002 · A. Dehbi, W. Wondrak, et al. · Microelectronics Reliability · 43
Vibration lifetime modelling of PCB assemblies using steinberg model
2005 · A. Dehbi, Y. Ousten, et al. · Microelectronics Reliability · 22
Defect detection in multilayer ceramic capacitors
2006 · V. Krieger, W. Wondrak, et al. · Microelectronics Reliability · 18
Failure mechanisms and qualification testing of passive components
2005 · H.A. Post, P. Letullier, et al. · Microelectronics Reliability · 10
Modular concept for power electronics in electric cars
2010 · W. Wondrak, A. Dehbi, et al. · International Conference on Integrated Power Electronics Systems (CIPS) · 6
An advanced hyperbolic shear deformation plate model for the bending study of functionally graded materials
2025 · Ali MEFTAH, Mohamed BELAIDI, et al. · The Journal of Engineering and Exact Sciences
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Effect of porosity distribution rate for the analysis of free vibrations of imperfect functionally graded plates
2025 · Ali Meftah, Atallah Dehbi, et al. · STUDIES IN ENGINEERING AND EXACT SCIENCES
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Reliability Analysis of Tantalum Capacitors for High Temperature Application
2002 · A. Dehbi, W. Wondrak, et al. · HAL
Works count: 8
Citation count: 99
H-index: 5
I10-index: 4
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