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Ayman Yehia Hamouda
Observed names:
A. Y. Hamouda,
Ayman Hamouda
Institution:
ASML (United States)
Observed institutions:
Ain Shams University,
University of Waterloo,
GlobalFoundries (United States),
ASML (United States),
GlobalFoundries (Germany),
Mentor Graphics (United States)
show all 6
OpenAlex ID:
A5067555739
Enhanced OPC recipe coverage and early hotspot detection through automated layout generation and analysis
2017
·
Ayman Hamouda
, Mohamed Bahnas
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
14
Efficient etch bias compensation techniques for accurate on-wafer patterning
2015
·
Mohamed Salama
, Ayman Hamouda
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
11
10nm local interconnect challenge with iso-dense loading and improvement with ALD spacer process
2016
·
Ming He
, Christopher Ordonio
, et al.
·
IEEE International Interconnect Technology Conference (IITC)
·
6
Wafer hotspot prevention using etch aware OPC correction
2016
·
Ayman Hamouda
, Dave Power
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Using segmented models for initial mask perturbation and OPC speedup
2013
·
Ayman Hamouda
, Mohab Anis
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Aerial image retargeting (AIR): achieving litho-friendly designs
2011
·
Ayman Yehia Hamouda
, James Word
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Inverse lithography OPC correction with multiple patterning and etch awareness
2018
·
Heon J. Choi
, Ayman Hamouda
·
SPIE Optical Microlithography
·
3
Model-Based Initial Bias (MIB): Toward a Single-Iteration Optical Proximity Correction
2015
·
Ayman Hamouda
, Mohab Anis
, et al.
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
3
Efficient model-based dummy-fill OPC correction flow for deep sub-micron technology nodes
2014
·
Ayman Hamouda
, Mohamed Salama
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Improved manufacturability in curvilinear OPC for random DRAM contacts
2025
·
Leo Seo
, Youngki Kwon
, et al.
·
DTCO and Computational Patterning
·
1
Combining mask and OPC process verification for improved wafer patterning and yield
2016
·
Ayman Hamouda
, Hesham Abdelghany
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
A holistic methodology to drive process window entitlement and its application to 20nm logic
2015
·
Lalit Shokeen
, Ayman Hamouda
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
Enabling reverse tone imaging for via levels using attenuated phase shift mask and source optimization
2013
·
Bassem Hamieh
, Hyun Chol Choi
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
AIR (Aerial Image Retargeting): A novel technique for in-fab automatic model-based retargeting-for-yield
2012
·
A. Y. Hamouda
, M. Anis
, et al.
·
Design, Automation, and Test in Europe
·
1
Three-dimensional Integrated Optics: Mmi Couplers for Multilevel Phasars
2005
·
Ayman Yehia Hamouda
, Diaa Khalil
·
Kluwer Academic Publishers eBooks
·
1
Design Techniques for Lithography-Friendly Nanometer CMOS Integrated Circuits
2015
·
Ayman Hamouda
·
UWSpace (University of Waterloo)
PDF
AIR (aerial image retargeting): a novel technique for in-fab automatic model-based retargeting-for-yield
2012
·
Ayman Hamouda
, Mohab Anis
, et al.
·
Design, Automation, and Test in Europe
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Works count:
17
Citation count:
57
H-index:
4
I10-index:
2
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