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Steven Lemke
Observed names:
Lemke, Steven,
S. Lemke,
S. M. Lemke,
S.M. Lemke
Institutions:
Microchip Technology (United States),
Microchip Technology (Germany)
Observed institutions:
Microchip Technology (United States),
Microchip Technology (Germany)
OpenAlex ID:
A5068270065
40nm Embedded Self-Aligned Split-Gate Flash Technology for High-Density Automotive Microcontrollers
2017
·
Danny Shum
, Lai Q. Luo
, et al.
·
IEEE International Memory Workshop (IMW)
·
22
A cost-efficient 28nm split-gate eFLASH memory featuring a HKMG hybrid bit cell and HV device
2018
·
R. Richter
, M. Trentzsch
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
15
Functionality Demonstration of a High-Density 2.5V Self-Aligned Split-Gate NVM Cell Embedded into 40nm CMOS Logic Process for Automotive Microcontrollers
2016
·
L. Q. Luo
, Z. Q. Teo
, et al.
·
IEEE International Memory Workshop (IMW)
·
10
A 55 nm Logic-Process-Compatible, Split-Gate Flash Memory Array Fully Demonstrated at Automotive Temperature with High Access Speed and Reliability
2015
·
Nhan Do
, Latt Tee
, et al.
·
IEEE International Memory Workshop (IMW)
·
10
Scaling Split-Gate Flash Memory Technology for Advanced MCU and Emerging Applications
2019
·
N. Do
, J. Kim
, et al.
·
IEEE International Memory Workshop (IMW)
·
8
Analog Tuning of Floating-Gate Cells with Sub-Elementary Charge Accuracy for In-Memory Computing Applications
2023
·
Yuri Tkachev
, Steven Lemke
, et al.
·
IEEE International Memory Workshop (IMW)
·
5
Integration of Split-gate Flash Memory in 130nm BCD technology For Automotive Applications
2019
·
Xiaobo Ma
, Zin Tun Thant
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
5
Modeling split-gate flash memory cell for advanced neuromorphic computing
2018
·
Mandana Tadayoni
, Santosh Hariharan
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
5
Scaling of Split-Gate Flash Memory for Embedded Controllers and Machine Learning Applications
2020
·
Nhan Do
, Steven Lemke
, et al.
·
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
·
4
Reliability and Accuracy of a Qualified Split-Gate Flash In-Memory Compute Technology
2025
·
Steven Lemke
, Louisa Schneider
, et al.
·
IEEE International Memory Workshop (IMW)
·
2
Evaluation of ESF3 Split-Gate Cell Cycling Endurance for Eeprom Applications
2024
·
Steven Lemke
, Louisa Schneider
, et al.
·
IEEE International Integrated Reliability Workshop final report
·
2
Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays
2023
·
Viktor Markov
, Gilles Festes
, et al.
·
IEEE International Memory Workshop (IMW)
·
2
Using I/sub DDQ/ drift testing to detect hydrogen in MOS devices
2002
·
E. Sabin
, S. Nagalingam
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
2
Assessing a 28 nm Split-Gate Flash Analog CIM Technology for Long-Term Reliability
2025
·
Louisa Schneider
, Steven Lemke
, et al.
·
IEEE International Integrated Reliability Workshop final report
·
1
Maximum safe reverse emitter voltage in bipolar transistors for reliable 10 year operation
2002
·
J. Scarpulia
, J. Dunkley
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
1
Demonstration of Fundamental Weight Accuracy Limits Using Bi-Directional Tuning of SuperFlash ESF3 Cells for Neuromorphic Computing
2026
·
Louisa Schneider
, Steven Lemke
, et al.
·
IEEE International Reliability Physics Symposium proceedings
Demonstration of Fundamental Weight Accuracy Limits using Bi-directional Tuning of SuperFlash ESF3 Cells for Neuromorphic Computing
2026
·
IEEE International Symposium on Reliability Physics 2026
, Do, Nhan
, et al.
·
Underline Science Inc.
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Works count:
17
Citation count:
94
H-index:
5
I10-index:
4
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