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Ying-Chih Lee
Institution:
Advanced Semiconductor Engineering (Taiwan)
Observed institutions:
National Pingtung University of Science and Technology,
Advanced Semiconductor Engineering (Taiwan),
National Cheng Kung University
OpenAlex ID:
A5068298580
Fan-Out Chip on Substrate Device Interconnection Reliability Analysis
2017
·
Ying-Chih Lee
, Wei-Hong Lai
, et al.
·
IEEE Electronic Components and Technology Conference (ECTC)
·
38
Finite element model verification for packaged printed circuit board by experimental modal analysis
2008
·
Ying-Chih Lee
, Bor-Tsuen Wang
, et al.
·
Microelectronics Reliability
·
28
Solder joint reliability analysis for large size WLCSP
2017
·
Meng-Kai Shih
, Hsin-Chih Shih
, et al.
·
International Conference on Electronics Packaging (ICEP)
·
12
Parameters study of thermomechanical reliability of board-level fan-out package
2017
·
Meng-Kai Shih
, Ying-Chih Lee
, et al.
·
International Conference on Electronics Packaging (ICEP)
·
7
Comparative Study on Mechanical and Thermal Performance of eWLB, M-Series™ and Fan-Out Chip Last Packages
2018
·
Meng-Kai Shih
, Eddie Tsai
, et al.
·
IEEE Electronic Components and Technology Conference (ECTC)
·
6
Deformation prediction of 2.5D IC package
2016
·
Ian Hu
, Ming-Han Wang
, et al.
·
International Microsystems, Packaging, Assembly and Circuits Technology Conference
·
6
Electrical, thermal and warpage investigation on high bandwidth PoP
2013
·
Mike Hung
, Chang-Chi Lee
, et al.
·
IEEE Electronics Packaging Technology Conference (EPTC)
·
6
Vibration and bondability analysis of fine-pitch Cu wire bonding
2011
·
Chang-Lin Yen
, Ying-Chih Lee
, et al.
·
International Conference on Electronic Packaging Technology (ICEPT)
·
4
Response prediction and verification for PCB with package due to thermal and random vibration coupling effects
2009
·
Bor-Tsuen Wang
, Fu-Xiang Hsu
, et al.
·
International Microsystems, Packaging, Assembly and Circuits Technology Conference
·
4
Large size WLCSP analysis on temperature cycling reliability test
2016
·
Hsin-Chih Shih
, Ying-Chih Lee
, et al.
·
International Microsystems, Packaging, Assembly and Circuits Technology Conference
·
2
3D WL MEMS with Various TSV Technologies' Thermo-Mechanical Analysis
2016
·
Ying-Te Ou
, Hung-Hsiang Cheng
, et al.
·
IEEE Electronic Components and Technology Conference (ECTC)
·
2
Calibration of Equivalent Finite Element Model for Packaged Printed Circuit Board by Experimental Modal Analysis
2008
·
Ying-Chih Lee
, Bor-Tsuen Wang
, et al.
·
IEEE Electronics Packaging Technology Conference (EPTC)
·
2
A refined finite element model verification for IC packaged PCB with thermal effects
2010
·
Bor-Tsuen Wang
, Xiu-Wei Liang
, et al.
·
International Microsystems, Packaging, Assembly and Circuits Technology Conference
·
1
3D WL MEMS with TSV last technology's mechanical analysis
2017
·
Hsiao-Yen Lee
, Chin-Cheng Kuo
, et al.
·
International Conference on Solid-State Sensors, Actuators and Microsystems
Spectrum response analysis for PCB with heating ICs in different heating conditions
2011
·
Bor-Tsuen Wang
, Yau-Chang Lee
, et al.
·
International Microsystems, Packaging, Assembly and Circuits Technology Conference
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Works count:
15
Citation count:
118
H-index:
6
I10-index:
3
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