Author

Lex Pillatsch

Observed names: L. Pillatsch, Pillatsch, Lex, Pillatsch, Lex (author)

Institution: Tofwerk (Switzerland)

Observed institutions: Tofwerk (Switzerland), Centre de recherche public Gabriel-Lippmann, Empa

OpenAlex ID: A5068768702

FIBSIMS: A review of secondary ion mass spectrometry for analytical dual beam focussed ion beam instruments

2018 · Lex Pillatsch, Fredrik Östlund, et al. · Progress in Crystal Growth and Characterization of Materials · 71

Towards secondary ion mass spectrometry on the helium ion microscope: An experimental and simulation based feasibility study with He+ and Ne+ bombardment

2012 · T. Wirtz, N. Vanhove, et al. · Applied Physics Letters · 50

Study and optimisation of SIMS performed with He+ and Ne+ bombardment

2013 · L. Pillatsch, N. Vanhove, et al. · Applied Surface Science · 40

Direct–Write Milling and Deposition with Noble Gases

2016 · Ivan Shorubalko, Lex Pillatsch, et al. · Nanoscience and technology · 31

Use of a duoplasmatron ion source for negative ion generation

2011 · L. Pillatsch, T. Wirtz, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 17

Multicomposite Nanostructured Hematite–Titania Photoanodes with Improved Oxygen Evolution: The Role of the Oxygen Evolution Catalyst

2017 · Mario Bärtsch, Marta Sarnowska, et al. · ACS Omega · 16

In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation

2020 · Lex Pillatsch, Szilvia Kalácska, et al. · Microscopy and Microanalysis · 15

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

2019 · Chengge Jiao, Lex Pillatsch, et al. · Microscopy and Microanalysis · 15

Tracing the Cross‐Talk Phenomenon of Vinylethylene Carbonate to Unveil its Counterintuitive Influence as an Electrolyte Additive on High‐Voltage Lithium‐Ion Batteries

2024 · Felix Pfeiffer, Angela Griggio, et al. · Advanced Energy Materials · 13

Secondary ion mass spectrometry on the helium ion microscope: A feasibility study of ion extraction

2012 · David Dowsett, Tom Wirtz, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 12

In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum

2022 · Jakub Jurczyk, Lex Pillatsch, et al. · Nanomaterials · 11

SIMS using O − , F − , Cl − , Br − and I − primary ion bombardment

2012 · L. Pillatsch, T. Wirtz · Surface and Interface Analysis · 11

Comparison of silicon and 4H silicon carbide patterning using focused ion beams

2015 · S.K.P. Veerapandian, S. Beuer, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 8

SIMS using negative primary ion bombardment

2010 · L. Pillatsch, T. Wirtz, et al. · Surface and Interface Analysis · 8

Imaging of Light Elements at the Nanometer Scale using fibTOF

2023 · Valentine Riedo-Grimaudo, Lex Pillatsch, et al. · Microscopy and Microanalysis · 2

Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope

2012 · T. Wirtz, L. Pillatsch, et al. · Microscopy and Microanalysis · 2

From Thin Film to Battery: FIB-SIMS with TOF Technology for High Resolution Chemical Imaging

2025 · Lex Pillatsch, Valentine Riedo-Grimaudo, et al. · Microscopy and Microanalysis · 1

Towards SIMS on the Helium Ion Microscope: Detection Limits and Experimental Results on the ORION

2013 · D. Dowsett, L. Pillatsch, et al. · Microscopy and Microanalysis · 1

Enhancing Identification Confidence in FIB-SIMS Through Higher Mass Resolving Power

2026 · Lex Pillatsch, Valentine Riedo-Grimaudo, et al. · Microscopy and Microanalysis

Chemical and Mechanical Correlative Mapping: Combining FIB-SIMS with Nanoindenter Hardness Measurements

2025 · Seiichi Shimizu, Lex Pillatsch, et al.

Tracing the Cross‐Talk Phenomenon of Vinylethylene Carbonate to Unveil its Counterintuitive Influence as an Electrolyte Additive on High‐Voltage Lithium‐Ion Batteries (Adv. Energy Mater. 39/2024)

2024 · Felix Pfeiffer, Angela Griggio, et al. · Advanced Energy Materials

The Value of Light Element Imaging Using FIB-SIMS for Material Characterization at Nanometer Scales

2024 · Lex Pillatsch, Valentine Riedo-Grimaudo, et al. · Microscopy and Microanalysis

High-resolution 3D chemical imaging of light elements by time-of-flight mass spectrometry

2024 · Valentine Riedo-Grimaudo, Lex Pillatsch, et al. · BIO Web of Conferences

O2 and H2O enhanced FEBIE for fabrication of nanopores in few layer graphene

2015 · Pillatsch, Lex (author), Vaz, Alfredo R. (author), et al. · DORA Empa (Swiss Federal Laboratories for Materials Science and Technology (Empa))

Bombardement ionique O‾, F‾, Br‾ et l‾ en SIMS : génération par duoplasmatron et étude du potentiel analytique

2010 · Lex Pillatsch · theses.fr (ABES)

Works count: 28

Citation count: 324

H-index: 11

I10-index: 12