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Boumediene Zatout

Observed names: B. Zatout, Zatout Boumediene
ORCID: 0000-0003-0004-9296
Observed ORCID: 0000-0003-0004-9296
OpenAlex ID: A5070292814
Recovery investigation of NBTI-induced traps in n-MOSFET devices
2020 · Boualem Djezzar, Abdelmadjid Benabdelmoumene, et al. · Microelectronics Reliability · 24
Analysis of I–V-T characteristics of Be-doped AlGaAs Schottky diodes grown on (100) GaAs substrates by molecular beam epitaxy
2022 · Slimane Oussalah, Walid Filali, et al. · Microelectronics Journal · 15
Analysis of NBTI Degradation in nMOS-Capacitors and nMOSFETs
2018 · Abdelmadjid Benabdelmoumene, Boualem Djezzar, et al. · IEEE Transactions on Device and Materials Reliability · 14
On the turn-around phenomenon in n-MOS transistors under NBTI conditions
2016 · A. Benabdelmoumene, B. Djezzar, et al. · Solid-State Electronics · 14
An efficient extrinsic capacitances extraction method for small‐signal GaN HEMT devices
2023 · Boumediene Zatout, Djabar Maafri, et al. · International Journal of Numerical Modelling Electronic Networks Devices and Fields · 4
NBTI Fast Electrical Characterization in pMOSFET Devices
2021 · DhiaElhak MESSAOUD, Boualem Djezzar, et al. · Algerian Journal of Signals and Systems · 4
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Fast Ids – Vgs Technique Implementation for NBTI Characterization
2020 · Messaoud Dhia Elhak, Zitouni Abdelkader, et al. · 4
Study and Analysis of NBTI Effect on pMOSFET Using Fast Measurement Technique
2023 · Abdelmadjid Benabdelmoumene, Boualem Djezzar, et al. · Russian Microelectronics · 3
Single Pulse Charge Pumping Technique Improvement for Interface-States Profiling in the Channel of MOSFET Devices
2023 · DhiaElhak Messaoud, Boualem Djezzar, et al. · IEEE Transactions on Device and Materials Reliability · 3
Extraction of bias dependent access resistances of advanced MOSFETs
2022 · Boumediene Zatout, Djabar Maafri, et al. · International Conference on Advanced Electrical Engineering (ICAEE) · 3
Fabrication and characterization of ZnO/Al2O3 thin film transistors: channel length effect study
2022 · Walid Filali, Fouaz Lekoui, et al. · International Multi-Conference on Systems, Signals & Devices (SSD) · 3
Efficient whale optimization algorithm to extract electrical parameters of different CMOS based diodes
2025 · Elyes Garoudja, Walid Filali, et al. · Physica Scripta · 1
Fast Methods for Studying the Effect of Electrical Stress on SiO2 Dielectrics in Metal-Oxide-Semiconductor Field-Effect Transistors
2023 · Dhia Elhak Messaoud, Boualem Djezzar, et al. · Instruments and Experimental Techniques · 1
Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) Pulsed Current-Voltage Characterization Technique: Design and Discussion
2023 · Dhia Elhak Messaoud, Boualem Djezzar, et al. · Instruments and Experimental Techniques · 1
An Efficient Extraction of the Bias Dependent Extrinsic Resistances of the HEMT GaN/SiC
2023 · Boumediene Zatout, Djabar Maafri, et al. · International Conference on Electronics, Energy and Measurement (IC2EM) · 1
Effect of Substrate Resistivity on Spiral Inductor in Radio Frequency Bands
2023 · Yasmina Belaroussi, Abdelkader Taibi, et al. · International Conference on Electronics, Energy and Measurement (IC2EM) · 1
Mechanical behavior of porous silicon: Ab initio and nanoindentation study
2025 · S. Bouchendouka, H. Lachenani, et al. · Materials Science and Technology
Efficient RF Small-Signal Parasitic Parameters Extraction Technique For The Advanced MOSFETs
2023 · Djabar Maafri, Boumediene Zatout, et al. · International Conference on Electronics, Energy and Measurement (IC2EM)
Works count: 18
Citation count: 96
H-index: 4
I10-index: 4
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