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Juzer M. Vasi
Observed names:
J Vasi,
J. M. Vasi,
J. Vasi,
J.M. Vasi,
Juzer Vasi,
VASI, J,
Vasi, J.
show all 7
Institutions:
Indian Institute of Technology Bombay,
National Centre for Photovoltaic Research and Education
Observed institutions:
Indian Institute of Technology Guwahati,
Johns Hopkins University,
Indian Institute of Technology Bombay,
Applied Materials (United States),
National Centre for Photovoltaic Research and Education,
Indian Institute of Science Bangalore,
Indian Institute of Technology Delhi
show all 7
ORCID:
0000-0002-6629-086X
Observed ORCID:
0000-0002-6629-086X
OpenAlex ID:
A5070628907
Photovoltaics at multi-terawatt scale: Waiting is not an option
2023
·
Nancy M. Haegel
, Pierre Verlinden
, et al.
·
Science
·
273
PDF
Visual Degradation in Field-Aged Crystalline Silicon PV Modules in India and Correlation With Electrical Degradation
2014
·
Shashwata Chattopadhyay
, Rajiv Dubey
, et al.
·
IEEE Journal of Photovoltaics
·
101
Comprehensive study of performance degradation of field‐mounted photovoltaic modules in India
2017
·
Rajiv Dubey
, Shashwata Chattopadhyay
, et al.
·
Energy Science & Engineering
·
87
PDF
Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs
2000
·
S. Mahapatra
, C.D. Parikh
, et al.
·
IEEE Transactions on Electron Devices
·
57
Analysis of Field Degradation Rates Observed in All-India Survey of Photovoltaic Module Reliability 2018
2019
·
Yogeswara Rao Golive
, Sachin Zachariah
, et al.
·
IEEE Journal of Photovoltaics
·
54
Performance degradation in field-aged crystalline silicon PV modules in different indian climatic conditions
2014
·
Rajiv Dubey
, Shashwata Chattopadhyay
, et al.
·
Conference record of the IEEE Photovoltaic Specialists Conference
·
54
Optimization and realization of sub-100-nm channel length single halo p-MOSFETs
2002
·
D.G. Borse
, M. Rani KN
, et al.
·
IEEE Transactions on Electron Devices
·
54
PDF
Correlating Infrared Thermography With Electrical Degradation of PV Modules Inspected in All-India Survey of Photovoltaic Module Reliability 2016
2018
·
Shashwata Chattopadhyay
, Rajiv Dubey
, et al.
·
IEEE Journal of Photovoltaics
·
47
A comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique
2000
·
S. Mahapatra
, C.D. Parikh
, et al.
·
IEEE Transactions on Electron Devices
·
40
Experimental observation of avalanche multiplication in charge-coupled devices
1983
·
S.K. Madan
, B. Bhaumik
, et al.
·
IEEE Transactions on Electron Devices
·
40
Recent developments in solar manufacturing in India
2022
·
Narendra Shiradkar
, Rajeewa Arya
, et al.
·
Solar Compass
·
38
PDF
Measurement of temperature coefficient of photovoltaic modules in field and comparison with laboratory measurements
2015
·
Rajiv Dubey
, Pranjal Batra
, et al.
·
Conference record of the IEEE Photovoltaic Specialists Conference
·
36
Effect of SiN on Performance and Reliability of Charge Trap Flash (CTF) Under Fowler–Nordheim Tunneling Program/Erase Operation
2009
·
C. Sandhya
, U. Ganguly
, et al.
·
IEEE Electron Device Letters
·
36
Impact of SiN Composition Variation on SANOS Memory Performance and Reliability Under nand (FN/FN) Operation
2009
·
C. Sandhya
, Apoorva B. Oak
, et al.
·
IEEE Transactions on Electron Devices
·
30
Solar Photovoltaics
2012
·
Chetan S. Solanki
, Brij M. Arora
, et al.
·
Foundation Books
·
29
Determining the optimal standard test condition correction procedure for high‐throughput field I–V measurements of photovoltaic modules
2021
·
Yogeswara Rao Golive
, Anil Kottantharayil
, et al.
·
Progress in Photovoltaics Research and Applications
·
28
A new approach to model nonquasi-static (NQS) effects for mosfets-part I: large-signal analysis
2003
·
A.S. Roy
, J.M. Vasi
, et al.
·
IEEE Transactions on Electron Devices
·
27
Failure Mode Analysis of PV Modules in Different Climatic Conditions
2020
·
Birinchi Bora
, O. S. Sastry
, et al.
·
IEEE Journal of Photovoltaics
·
24
A simulation of the multiple trapping model for continuous time random walk transport
1993
·
V. Vasudevan
, J. Vasi
·
Journal of Applied Physics
·
24
Nitride engineering and the effect of interfaces on Charge Trap Flash performance and reliability
2008
·
C. Sandhya
, U. Ganguly
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
23
A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs
1999
·
S Mahapatra
, C.D Parikh
, et al.
·
Solid-State Electronics
·
23
A numerical simulation of hole and electron trapping due to radiation in silicon dioxide
1991
·
V. Vasudevan
, J. Vasi
·
Journal of Applied Physics
·
23
Drain Current Model Including Velocity Saturation for Symmetric Double-Gate MOSFETs
2008
·
Venkatnarayan Hariharan
, Juzer Vasi
, et al.
·
IEEE Transactions on Electron Devices
·
22
Performance of Field-Aged PV Modules in India: Results from 2016 All India Survey of PV Module Reliability
2017
·
Rajiv Dubey
, Sachin Zachariah
, et al.
·
Conference record of the IEEE Photovoltaic Specialists Conference
·
21
All India Survey of Photovoltaic Module Degradation 2014: Survey methodology and statistics
2015
·
Shashwata Chattopadhyay
, Rajiv Dubey
, et al.
·
Conference record of the IEEE Photovoltaic Specialists Conference
·
21
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Works count:
180
Citation count:
1,882
H-index:
22
I10-index:
53
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