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Alfred Lechner

Observed names: A. Lechner, Lechner, Alfred
Institution: OTH Regensburg
Observed institution: OTH Regensburg
OpenAlex ID: A5070645846
Isotropic wet chemical etching of deep channels with optical surface quality in silicon with HNA based etching solutions
2013 · Michael Bauhuber, Andreas Mikrievskij, et al. · Materials Science in Semiconductor Processing · 37
Three-in-one enzyme assay based on single molecule detection in femtoliter arrays
2015 · Raphaela B. Liebherr, Albert Hutterer, et al. · Analytical and Bioanalytical Chemistry · 24
Collapse Mechanisms for High Aspect Ratio Structures with Application to Clean Processing
2009 · Daniel Peter, Frank Holsteyns, et al. · ECS Transactions · 9
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Measurement of the Mechanical Stability of Semiconductor Line Structures in Relevant Media
2009 · Daniel Peter, Michael Dalmer, et al. · ECS Transactions · 4
Effect of temperature on the growth of Cupric and Cuprous Nanoparticles in a wet chemical synthesis
2024 · T. Schwarz, A. Pastötter, et al. · Materials Letters · 2
Tunable nanopillar array on a quartz-fiber tip for surface enhanced Raman scattering (SERS) detection
2021 · Evgeny Melekhov, Tatjana Penn, et al. · tm - Technisches Messen · 2
Measurement of the mechanical stability of semiconductor line structures in drying liquids with application to pattern collapse
2011 · Daniel Peter, Michael Dalmer, et al. · Journal of Micromechanics and Microengineering · 2
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Silicon Rich Oxide with controlled mean size of silicon nanocrystals by deposition in multilayers
2009 · E. Quiroga, W. Bensch, et al. · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon · 2
Measurement of the Stability and Investigation of the Rupture Behavior of Semiconductor Line Nanostructures by AFM
2008 · Daniel Peter, Michael Dalmer, et al. · ECS Transactions · 2
Electrophoretic Studies on Silicon Nitride: Traces of Silicates in UPW Shift Zeta Potential Similar to SC-1
2005 · Alexander Pfeuffer, Wolfgang Bensch, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2
New Single Wafer Double Sided Spin Cleaning Method
2001 · Walter Starflinger, Reinhard Sellmer, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2
Silicon micro venturi nozzles for cost-efficient spray coating of thin organic P3HT/PCBM layers
2016 · Michael A Betz, Patric Büchele, et al. · Journal of Micromechanics and Microengineering · 1
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Solid Bridging during Pattern Collapse (Stiction) Studied on Silicon Nanoparticles
2011 · Daniel Peter, Michael Dalmer, et al. · MRS Proceedings · 1
The Active Role of Etch Products in Particle Removal by SC-1 Solutions
2007 · Alexander Pfeuffer, Wolfgang Bensch, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1
SERS Substrate Enhancement Factor (SSEF) determination using Gas Chromatography–Mass spectrometry (GC–MS): A simplified approach
2026 · Valerius Abb, Tatjana Penn, et al. · Analytica Chimica Acta
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Effect of Temperature on the Growth of Cu(I)O Nanocubes: The Impact of the Copper Precursor Species
2024 · Tobias Schwarz, Angelina Pastötter, et al. · SSRN Electronic Journal
薄い有機p3ht/pcbm(フェニルc61酪酸メチルエステル)層のコスト効率的な吹付け塗りのためのシリコンマイクロベンチュリノズル
2017 · Betz Michael A, Buechele Patric, et al. · Journal of Micromechanics and Microengineering
Real-Time Analyses of Metal Contaminations in the ppb-Range
2012 · Albert Hutterer, Michael Bauhuber, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
The Influence of Liquid Media on the Fracture Strength of Polysilicon Nanostructures
2012 · Daniel Peter, Michael Dalmer, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
A Study on the Structure Collapse Mechanisms for High Aspect Ratio Structures with Application to Clean Processing
2009 · Daniel Peter, Frank Holsteyns, et al. · ECS Meeting Abstracts
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Characterization of Post Etch Residues Depending on Resist Removal Processes after Aluminum Etch
2009 · Maria Heidenblut, D. Sturm, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Measurement of the Mechanical Stability of Semiconductor Line Structures in Relevant Media
2008 · Daniel Peter, Michael Dalmer, et al. · ECS Meeting Abstracts
PDF
Measurement of the Stability and Investigation of the Rupture Behavior of Semiconductor Line Nanostructures by AFM
2008 · Daniel Peter, Michael Dalmer, et al. · ECS Meeting Abstracts
PDF
The Active Role of Etch Products in Particle Removal by SC-1 Solutions
2007 · Alexander Pfeuffer, Wolfgang Bensch, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Electrophoretic Studies on Silicon Nitride: Traces of Silicates in UPW Shift Zeta Potential Similar to SC-1
2005 · Alexander Pfeuffer, Wolfgang Bensch, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Works count: 28
Citation count: 91
H-index: 4
I10-index: 2
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