Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Lienhard Wegmann
Observed names:
L Wegmann,
L. WEGMANN,
L. Wegmann,
Wegmann, Lienhard
Institution:
Oerlikon (Liechtenstein)
Observed institution:
Oerlikon (Liechtenstein)
OpenAlex ID:
A5071680492
Auf dem Weg zum Metall-Elektronenmikroskop / Progress towards a Metallurgical Electron Microscope
1968
·
Lienhard Wegmann
·
Practical Metallography
·
18
Photo Emission Electron Microscopy
1969
·
L. Wegmann
·
Springer eBooks
·
17
Historical perspective and future trends for ion implantation systems
1981
·
Lienhard Wegmann
·
Nuclear Instruments and Methods in Physics Research
·
15
Influence of depth of information and of resolution in stereologic evaluation of surface electron micrographs
1972
·
M. Bode
, G. Pfefferkorn
, et al.
·
Journal of Microscopy
·
8
The Historical Development of Ion Implantation
1984
·
Lienhard Wegmann
·
Elsevier eBooks
·
7
Investigations of Carbon Residues on Surfaces of Silicon Integrated Circuits
1974
·
P. V. Fontana
, J. P. Decosterd
, et al.
·
Journal of The Electrochemical Society
·
7
Observations of Reactions in Solids and Formation of Surface Layers with the Emission Electron Microscope
1969
·
Ch. Zaminer
, R. Graber
, et al.
·
Journal of Vacuum Science and Technology
·
6
A high current ion implanter with hybrid scanning
1980
·
J. Camplan
, J. Chaumont
, et al.
·
Nuclear Instruments and Methods
·
4
"analytical Methods in Photoemission Electron Microscopy"
1972
·
L. Wegmann
·
University of California Press eBooks
·
2
High Temperature Microscopy Studies.
1971
·
H.D. Dannoehl
, R. Graber
, et al.
·
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
·
1
[Photoemission electron microscopy. principles and special applications (author's transl)].
1977
·
L Wegmann
·
PubMed
ChemInform Abstract: INVESTIGATIONS OF CARBON RESIDUES ON SURFACES OF SILICON INTEGRATED CIRCUITS
1974
·
P. V. FONTANA
, J. P. DECOSTERD
, et al.
·
ChemInform
Use of the Photoemission Electron Microscope as a High-Vacuum Hot-Stage Microscope for Temperatures up to 2000°C
1970
·
H.-D. Dannöhl
, L. Wegmann
·
Journal of Vacuum Science and Technology
New Emission Electron Microscope for High-temperature Investigations.
1970
·
L. Wegmann
, Ch. Zaminer
·
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Ein hochauflösendes Photoemissions-Elektronenmikroskop für metallographische Untersuchungen bei mittleren und hohen Temperaturen
1968
·
R. Graber
, M. Gribi
, et al.
·
Zeitschrift für angewandte Mathematik und Physik
Show more works
View as search
Works count:
17
Citation count:
85
H-index:
6
I10-index:
3
Year
Topic
Type
