Work

Use of the Photoemission Electron Microscope as a High-Vacuum Hot-Stage Microscope for Temperatures up to 2000°C

Year: 1970

Type: article

Source: Journal of Vacuum Science and Technology

DOI: 10.1116/1.1315911

Authors: H.-D. Dannöhl, L. Wegmann

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1995437707

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