Author

Mark R. Skokan

Observed names: M. R. Skokan, M. Skokan, M.R. Skokan, Mark Skokan, Skokan, Mark
OpenAlex ID: A5076433578
1979 · M. R. Skokan, W. G. Moulton, et al. · Physical review. B, Condensed matter · 94
2005 · C.A. Musc, J. Antoszewski, et al. · IEEE Electron Device Letters · 61
2006 · C.A. Bower, D. Malta, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 48
2014 · J. M. Armstrong, M. R. Skokan, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 36
2008 · A.J. Keating, J. Antoszewski, et al. · Journal of Electronic Materials · 31
2022 · P. Duke Anderson, Jeffrey D. Beck, et al. · Journal of Electronic Materials · 29
2015 · William Sullivan, Jeffrey Beck, et al. · Journal of Electronic Materials · 28
2006 · D. Temple, C. A. Bower, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 27
2009 · Jeffrey Beck, Richard Scritchfield, et al. · Journal of Electronic Materials · 21
1981 · E. F. Skelton, M. R. Skokan, et al. · Journal of Applied Crystallography · 19
1976 · M. R. Skokan, R. C. Morris, et al. · Physical review. B, Solid state · 16
2008 · Dorota Temple, Dean Malta, et al. · ECS Transactions · 15
2008 · A.I. D’Souza, M.G. Stapelbroek, et al. · Journal of Electronic Materials · 13
2006 · P. Mitra, J. D. Beck, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2006 · P. Mitra, J. D. Beck, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
1980 · M.R. Skokan, E.F. Skelton, et al. · Journal of Physics and Chemistry of Solids · 12
2005 · J. Antoszewski, K. J. Winchester, et al. · Journal of Electronic Materials · 10
2013 · Jeff Beck, James McCurdy, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2009 · A. I. D'Souza, E. W. Robinson, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2005 · J. Antoszewski, K. J. Winchester, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2014 · Dorota S. Temple, Dean Malta, et al. · IEEE International D Systems Integration Conference · 6
2006 · A. I. D'Souza, M. G. Stapelbroek, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
1976 · R.K. Stanley, M.R. Skokan, et al. · Solid State Communications · 6
2025 · Arash Dehzangi, John Armstrong, et al. · Journal of Electronic Materials · 5
2007 · D. Temple, J. M. Lannon, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Works count: 43
Citation count: 562
H-index: 13
I10-index: 17
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