Author

Edward H. Snow

Observed names: E Snow, E. H. SNOW, E. H. Snow, E.H. Snow

Observed institutions: University of Utah, Fairchild Semiconductor (United States)

OpenAlex ID: A5076747537

Fowler-Nordheim Tunneling into Thermally Grown SiO2

1969 · M. Lenzlinger, E. H. Snow · Journal of Applied Physics · 1,710

Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon

1967 · B. E. Deal, M. Sklar, et al. · Journal of The Electrochemical Society · 743

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Ion Transport Phenomena in Insulating Films

1965 · E. H. Snow, A. S. Grove, et al. · Journal of Applied Physics · 533

Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures

1965 · A.S. Grove, B.E. Deal, et al. · Solid-State Electronics · 417

Effects of ionizing radiation on oxidized silicon surfaces and planar devices

1967 · E.H. Snow, A.S. Grove, et al. · Proceedings of the IEEE · 324

Barrier energies in metal-silicon dioxide-silicon structures

1966 · B.E. Deal, E.H. Snow, et al. · Journal of Physics and Chemistry of Solids · 238

Surface Effects on Metal-Silicon Contacts

1968 · A. Y. C. Yu, E. H. Snow · Journal of Applied Physics · 141

Polarization Phenomena and Other Properties of Phosphosilicate Glass Films on Silicon

1966 · E. H. Snow, B. E. Deal · Journal of The Electrochemical Society · 124

Observation of Impurity Redistribution During Thermal Oxidation of Silicon Using the MOS Structure

1965 · B. E. Deal, A. S. Grove, et al. · Journal of The Electrochemical Society · 120

Simple Physical Model for the Space-Charge Capacitance of Metal-Oxide-Semiconductor Structures

1964 · A. S. Grove, E. H. Snow, et al. · Journal of Applied Physics · 78

Fowler-Nordheim tunneling in SiO2 films

1967 · E.H. Snow · Solid State Communications · 70

A model for radiation damage in metal-oxide-semiconductor structures

1966 · A.S. Grove, E.H. Snow · Proceedings of the IEEE · 66

Minority carrier injection of metal-silicon contacts

1969 · A.Y.C. Yu, E.H. Snow · Solid-State Electronics · 58

Space-Charge Polarization in Glass Films

1966 · E. H. Snow, M. E. Dumesnil · Journal of Applied Physics · 50

Properties of Gold Doped MOS Structures

1967 · S. F. Cagnina, E. H. Snow · Journal of The Electrochemical Society · 46

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Self-Scanned Digicon: a Digital Image Tube for Astronomical Spectroscopy

1975 · Robert G. Tull, John P. Choisser, et al. · Applied Optics · 41

Barrier Lowering and Field Penetration at Metal-dielectric Interfaces

1966 · C. A. Mead, E. H. Snow, et al. · Applied Physics Letters · 40

Fowler-Nordheim tunneling into thermally grown SiO 2

1968 · M. Lenzlinger, E.H. Snow · IEEE Transactions on Electron Devices · 37

Dielectric Loss due to Impurity Cation Migration in α Quartz

1964 · E. H. Snow, P. Gibbs · Journal of Applied Physics · 35

Investigation of thermally oxidized silicon surfaces using metal-oxide-semiconductor structures

1964 · A.S. Grove, B.E. Deal, et al. · IEEE Transactions on Electron Devices · 30

p-Channel Charge-Coupled Devices with Resistive Gate Structure

1972 · Choong-Ki Kim, E. H. Snow · Applied Physics Letters · 26

Radiation Effects on Silicon Schottky Barriers

1969 · A. Y. C. Yu, E. H. Snow · IEEE Transactions on Nuclear Science · 20

A Study of Failure Mechanisms in Silicon Planar Epitaxial Transistors.

1966 · Harry Sello, I. A. Blech, et al. · 19

Comparison of surface and bulk effects of nuclear reactor radiation on planar devices

1968 · D.J. Fitzgerald, E.H. Snow · IEEE Transactions on Electron Devices · 11

Radiation Study on Mos Structures

1967 · E. H. Snow, Andrew S. Grove, et al. · Defense Technical Information Center (DTIC) · 10

Works count: 42

Citation count: 4,996

H-index: 21

I10-index: 25